FXR Optimization Project: Determining Beam Quality By Cathode Plasma Image Analysis

Houck, T.; Ong, M M; Paris, R D

doi:10.2172/1059080

Cited by 1 publication

(1 citation statement)

References 18 publications

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“…Cathode imaging has been performed to characterize the cathode physics on a number of diodes that can be separated into two categories: the first being diodes with < 1.6 and < 0.78 and A-K gaps ranging from 0.8-5 cm [15][16][17][18][19] and the second are relativistic diodes with > 4.9 and > 0.98 with A-K gaps > 8 cm [20,21]. Refs.…”

Section: Introductionmentioning

confidence: 99%

Characterizing the photon spectrum in the DARHT Axis-I diode

Coleman¹,

Johnson²,

McCuistian³

et al. 2014

2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) Held With 2014 IEEE International Conference on High-Power P

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An array of photon diagnostics have been deployed on a high power relativistic electron beam diode. Surface flashover of a carbon fiber velvet cathode generates a discharge from which electrons are accelerated through a 17.8 cm diode. This discharge is assumed to be a hydrocarbon mixture. A small portion of the off energy electrons (1-3 MeV) accelerated during the rise and fall of the 80 ns FWHM pulse impact the beam pipe and generate a Bremsstrahlung spectrum of 0.1-3 MeV photons. The principal objective of these experiments is to quantify the dynamics of the hard X-ray and -ray flux generated in the diode region, in addition to quantifying dynamics of the visible photons generated, and the ion species of the surface discharge on the velvet cathode. A qualitative comparison of different diagnostic results are presented, which include time resolved measurements with X-ray PIN diodes, a PMT, and CCD images. In addition initial visible spectroscopy measurements will also be presented.

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