1975
DOI: 10.1109/tmtt.1975.1128504
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GaAs and GaAlAs Devices for Integrated Optics .

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Cited by 24 publications
(4 citation statements)
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“…4.7, the cutoff condition (3.31) can be used in conjunction with (4.10) to calculate what Al concentration is required to produce waveguiding of a given mode. Figure 4.11 shows the results of such a calculation for + he case of waveguiding of the two lowest order modes of 0.9 μm wavelength light in Ga (1−x) Al x As waveguides of various thicknesses and Al concentrations [52]. Note the sharp increase in Al concentration difference (y − x) required for thickness/wavelength ratios less than about 0.8, particularly in the case of the m = 1 mode.…”
Section: Ga (1−x) Al X As Epitaxially Grown Waveguidesmentioning
confidence: 99%
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“…4.7, the cutoff condition (3.31) can be used in conjunction with (4.10) to calculate what Al concentration is required to produce waveguiding of a given mode. Figure 4.11 shows the results of such a calculation for + he case of waveguiding of the two lowest order modes of 0.9 μm wavelength light in Ga (1−x) Al x As waveguides of various thicknesses and Al concentrations [52]. Note the sharp increase in Al concentration difference (y − x) required for thickness/wavelength ratios less than about 0.8, particularly in the case of the m = 1 mode.…”
Section: Ga (1−x) Al X As Epitaxially Grown Waveguidesmentioning
confidence: 99%
“…4.14 Diagram of a basic electro-optic waveguide reasonable substrate carrier concentration of 10 16 cm −3 , application of V = 100 V, i.e., the maximum allowed if avalanche breakdown is to be avoided, would produce a depletion layer thickness t g = 3.6 μ m. This result is based on an abrupt junction calculation [76]. In that case, the resulting change in index, from (4.11), would be Δn = 8.3 ×10 −4 , where we have used n = 3.4 and n 3 r 41 = 6 × 10 −11 m/V for GaAs [52]. From (3.31), it can be seen that the lowest order mode would be guided in this case, but just barely.…”
Section: Electro-optic Waveguidesmentioning
confidence: 99%
“…In performing these calculations the dominant waveguide dispersion has been considered but not material dispersion [23], although this could be readily included in a similar manner. In the second set of calculations the effective refractive index profile used is recalculated at each wavelength and OCW excitation is used in the TD-BPM.…”
Section: Wavelength Sensitivity Of the MMI Structurementioning
confidence: 99%
“…5, while the upper curves will approach the free-carrier absorption loss in the waveguide given asg'. 9 From equations (5) and (6), this leads to…”
mentioning
confidence: 99%