“…Due to the inherently poor silicon Hall sensor material properties, devices made of III-V semiconductors have attracted a great deal of interest by virtue of their high electron mobility combined with moderate sheet carrier densities, low temperature dependences of the output Hall voltage and large signal-to-noise ratios (S/N) [6]- [10]. However, the majority of this work to date has been concerned with single Hall elements with no reports of fully integrated Hall Effect circuit using the III-V semiconductors apart from [11]- [13] describing a hybrid circuit using ion implanted GaAs for which the performances were less than ideal due to the difficulties of Manuscript received September 21, 2014; revised November 2, 2014; accepted November 2, 2014. Date of publication November 5, 2014; date of current version January 15, 2015.…”