2017
DOI: 10.1007/s00542-017-3293-0
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Gallium nitride MEMS resonators: how residual stress impacts design and performances

Abstract: Starting from Gallium Nitride (GaN) epitaxially grown on silicon, pre-stressed micro-resonators with integrated piezoelectric transducers have been designed, fabricated, and characterized. In clamped-clamped beams, it is well known that tensile stress can be used to increase the resonant frequency. Here we calculate the mode shape functions of out-of-plane flexural modes in prestressed beams and we derive a model to predict both the resonant frequency and the piezoelectric actuation factor. We show that a good… Show more

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Cited by 10 publications
(7 citation statements)
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“…The resonant frequency of the PMUT can be expressed as [ 29 ] where is the radius of the PMUT diaphragm, is the average plate modulus, is the average density, is the total layer thickness, and is the stress induced by the DC bias voltage. As can be seen in the equation, the resonant frequency of the PMUT is sensitive to when the ratio ( ) is large [ 30 ]. It provides a way to manipulate the resonant frequency via the modification of by applying a voltage to the piezoelectric films of PMUT devices, which is also beneficial to extend the bandwidth.…”
Section: Results and Analysismentioning
confidence: 99%
“…The resonant frequency of the PMUT can be expressed as [ 29 ] where is the radius of the PMUT diaphragm, is the average plate modulus, is the average density, is the total layer thickness, and is the stress induced by the DC bias voltage. As can be seen in the equation, the resonant frequency of the PMUT is sensitive to when the ratio ( ) is large [ 30 ]. It provides a way to manipulate the resonant frequency via the modification of by applying a voltage to the piezoelectric films of PMUT devices, which is also beneficial to extend the bandwidth.…”
Section: Results and Analysismentioning
confidence: 99%
“…During the growth of multi-layer films, it is inevitable to bring residual stress in the process, resulting in the WCR having the tensile prestress of the material layer [ 65 ]. The model is considered as shown in Figure 5 c. When the initial prestress gradually increases from 0 to 4 MPa, the elastic anisotropy energy density increases, making decrease and reduces the consequently.…”
Section: Resultsmentioning
confidence: 99%
“…Currently, both our COMSOL simulations and analytic model assume the global damping to be characterized by a Q-factor that does not explicitly depend on the stress, without considering any specific physical mechanisms of dissipation. a See [29] for experimental setup and studies in more detail.…”
Section: Results Of Highly Stressed Resonators Obtained By Different ...mentioning
confidence: 99%