Partial substitution of aluminium with gallium in the Na 8 [Al 1Ày Ga y SiO 4 ] 6 (NO 2 ) 2 sodalite system (y ¼ 0-1) revealed an extensive isomorphous miscibility. Each composition (y ¼ 0-1) is isotypic to either the alumosilicate or gallosilicate end members (y ¼ 0 or 1, respectively). The Al/Ga ratio was controlled by selective initial stoichiometries in the direct hydrothermal syntheses. The samples were investigated by X-ray powder diffraction, SEM, FTIR and 29 Si MAS NMR spectroscopies. The gallium concentration in the framework was calculated using the X-ray data Rietveld refinement, which was always lower than the feed concentration in each composition. The cell parameter and tilt angle increased, while the T--O--T angle and six-ring window dimension decreased with increasing gallium content in the framework. The Al/Ga--O distance is the mean of Al--O and Ga--O distances and increases with increasing gallium content. In contrast, the Si--O distance fluctuates close to 163 pm with increasing gallium insertion. The broadening of the XRD peaks in the patterns with mid-range gallium concentrations (y ¼ 0.35-0.70) is associated with the formation of Al-rich and Garich domains, which is explained in terms of Al/Ga--O distances and average crystal size with respect to Al/Ga ratio in the framework. The domains are assumed to be smaller than the coherence length of the X-ray radiation but large enough to detect by MAS NMR techniques.