2023
DOI: 10.1002/qre.3348
|View full text |Cite
|
Sign up to set email alerts
|

Gamma generalized linear model‐based control charts for high‐purity processes

Abstract: Statistical process monitoring of high‐purity manufacturing processes becomes challenging if the defect rate depends on the fluctuations of a set of covariates (e.g., inspected weight, volume, temperature). This paper applies the generalized linear model framework to statistical process control for detecting contextual anomalies in high‐purity processes. Different types of predictive residuals (i.e., Pearson, deviance, and quantile) and recursive residuals are considered, and the performance of these schemes i… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 25 publications
0
0
0
Order By: Relevance