Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference, 2005.
DOI: 10.1109/pvsc.2005.1488079
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GaN betavoltaic energy converters

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Cited by 26 publications
(14 citation statements)
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“…Theoretical calculations from a conceptual design 24,91 utilized two GaN pn junctions sandwiched with a 63 Ni radioisotope source (with a half-life of 100 yr). The results indicated a maximum short circuit current of 1.1 lA/cm 2 , maximum open circuit voltage of 2.7 V, and ideal efficiency of 25%.…”
Section: Betavoltaic Applicationmentioning
confidence: 99%
See 1 more Smart Citation
“…Theoretical calculations from a conceptual design 24,91 utilized two GaN pn junctions sandwiched with a 63 Ni radioisotope source (with a half-life of 100 yr). The results indicated a maximum short circuit current of 1.1 lA/cm 2 , maximum open circuit voltage of 2.7 V, and ideal efficiency of 25%.…”
Section: Betavoltaic Applicationmentioning
confidence: 99%
“…For X-ray detectors, Schottky Metal-Semiconductor-Metal (MSM), 15 Schottky diode, 16,17 and p-i-n structures 22 have all been reported. For electron detection, the applications for making betavoltaic energy converters, 23,24 using pn, 25 p-i-n, 23,[26][27][28] and Schottky type 29 structures have now been tested. Thermal neutron detection using a 6 Li converter in a sandwich structure has been recently reported.…”
mentioning
confidence: 99%
“…The saturation of I sc in terms of the increase in CPS is expected to occur based on the limited size of the absorber surface for the given thicknesses of the absorber and irradiator. A larger surface area for the entry of beta particles into the absorber results in greater energy deposition and higher power generation for the betavoltaic cells .…”
Section: Measurement Resultsmentioning
confidence: 99%
“…36,37 It was assumed that all EHPs created in the depletion region along the trajectory of betas and within one minority carrier diffusion length from the depletion region can be collected as current in the simulations. 38,39 Decreasing the doping concentration in the p-region in p-i-n devices will increase the depletion region width and thus increase the EHPs produced by beta particles along the way. However, the doping concentration decrease will cause higher leakage currents.…”
Section: Simulation Of Beta Particle Penetration In Ganmentioning
confidence: 99%