2022
DOI: 10.1063/5.0086957
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GaN HEMTs on low resistivity Si substrates with thick buffer layers for RF signal amplification and power conversion

Abstract: We report GaN high-electron-mobility transistors (HEMTs) with a thick (7.7 µm) GaN buffer on a Czochralski low resistivity Si (LRS) substrate. The GaN HEMTs exhibit high performance for both radio-frequency (RF) amplification and power conversion. The thick GaN buffer was grown by means of vacancy engineering, delivering a low dislocation density of ∼1.6 × 108 cm−2, contributing to suppressed RF signal coupling to the lossy Si substrate and a high vertical voltage blocking capability. For RF performance, GaN H… Show more

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Cited by 6 publications
(1 citation statement)
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“…
GaN semiconductor materials have characteristics of large energy band gap, high electron saturation velocity, high breakdown field strength, and good thermal stability, which have broad application prospects in the preparation of radio frequency (RF) and power electronic devices. [1][2][3] Si substrates are inexpensive and easy to obtain different sizes (2-12 inches) and different types (n-type/p-type/high resistivity) of substrates, which can meet different epitaxial growth process requirements. Si-based GaN devices can be integrated with traditional Si-based devices on the same wafer, facilitating the formation of functional modules directly for terminal applications, [4][5][6] the growth of GaN-on-Silicon is receiving more and more attention.
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mentioning
confidence: 99%
“…
GaN semiconductor materials have characteristics of large energy band gap, high electron saturation velocity, high breakdown field strength, and good thermal stability, which have broad application prospects in the preparation of radio frequency (RF) and power electronic devices. [1][2][3] Si substrates are inexpensive and easy to obtain different sizes (2-12 inches) and different types (n-type/p-type/high resistivity) of substrates, which can meet different epitaxial growth process requirements. Si-based GaN devices can be integrated with traditional Si-based devices on the same wafer, facilitating the formation of functional modules directly for terminal applications, [4][5][6] the growth of GaN-on-Silicon is receiving more and more attention.
…”
mentioning
confidence: 99%