2008
DOI: 10.1002/pssc.200778490
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GaN thin films on z‐ and x ‐cut LiNbO3 substrates by MOVPE

Abstract: We report epitaxial growth of GaN layers on z ‐ and x ‐cut LiNbO3 substrates using MOVPE. GaN layers with the thickness of 450 nm were characterized using X‐ray diffraction. For both, z‐ and x‐ cut orientations of LiNbO3 substrates, the GaN layers have c‐axis orientation normal to the substrate plane and the in‐plane lattice orientation of GaN layers coincides with the primary axes of LiNbO3 substrates. Although GaN layers exhibit almost complete strain relaxation, the residual compressive strain determined wi… Show more

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Cited by 11 publications
(6 citation statements)
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“…Fast Fourier transformation of the real-space AFM images shows an oblique surface unit cell with lattice parameters of a = 0.75 ± 0.02 nm, b = 0.54 ± 0.02 nm, and α = 94.8 • . Surprisingly, the measured pattern shows some deviation in the oxygen sublattice from the ideal template (Chase 1998) that gives rise to the quasi lattice matched GaN growth on the LiNbO 3 x face demonstrated in Ougazzaden et al (2008). This notwithstanding, as no evidence of long ranging reconstructions at the x-cut has been found experimentally, available computational investigations are restricted to 1 × 1 surface unit cell Schmidt 2010c, Sanna et al 2014b).…”
Section: The X-cutmentioning
confidence: 96%
“…Fast Fourier transformation of the real-space AFM images shows an oblique surface unit cell with lattice parameters of a = 0.75 ± 0.02 nm, b = 0.54 ± 0.02 nm, and α = 94.8 • . Surprisingly, the measured pattern shows some deviation in the oxygen sublattice from the ideal template (Chase 1998) that gives rise to the quasi lattice matched GaN growth on the LiNbO 3 x face demonstrated in Ougazzaden et al (2008). This notwithstanding, as no evidence of long ranging reconstructions at the x-cut has been found experimentally, available computational investigations are restricted to 1 × 1 surface unit cell Schmidt 2010c, Sanna et al 2014b).…”
Section: The X-cutmentioning
confidence: 96%
“…Furthermore, LN has attracted a lot of attention as a substrate for the GaN growth, either for the realization of monolithic optoelectronic amplifiers [7][8][9] or as an alternative substrate ͑to ␣-Al 2 O 3 ͒ for the quasilattice matched growth of GaN. [10][11][12][13] The microscopic understanding of LN surfaces is comparatively poor, however. This is due in part to the lack of surface analysis studies performed in ultrahigh vacuum and in part to the nature of the material itself.…”
Section: Introductionmentioning
confidence: 99%
“…1 On the other hand, ferroelectric ͑FE͒ materials have excellent properties of switchable polarization, piezoelectricity, pyroelectricity, electro-opticity, and voltage tunable dielectric constant. [10][11][12] The progress in atomic-scale control of heterointerfacial structure makes it possible to explore and utilize new physical properties, which arise from the multilayer that are not found in neither of their constituents. This might lead to the possibility of new materials and device design.…”
Section: Introductionmentioning
confidence: 99%