2012
DOI: 10.1063/1.4706573
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GaP heteroepitaxy on Si(001): Correlation of Si-surface structure, GaP growth conditions, and Si-III/V interface structure

Abstract: Polarity determination of a-plane GaN on r -plane sapphire and its effects on lateral overgrowth and heteroepitaxy J. Appl. Phys. 94, 942 (2003); 10.1063/1.1578530Morphological aspects of continuous and modulated epitaxial growth of (GaIn)P GaP-layers on Si(001) can serve as pseudo-substrates for a variety of novel optoelectronic devices. The quality of the GaP nucleation layer is a crucial parameter for the performance of such devices. Especially, anti-phase domains (APDs) evolving at mono-atomic steps on the… Show more

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Cited by 91 publications
(73 citation statements)
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“…First, we will assume the abrupt interface, which is also discussed by Beyer et al [20]. While this configuration is not the energetically most favored one, growth in MOVPE, however, takes place under highly nonequilibrium conditions and even energetically less favored states may result and be "frozen" in the following process (cf.…”
Section: B Experimentally Observed Gap/si(100) Interface Structuresmentioning
confidence: 97%
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“…First, we will assume the abrupt interface, which is also discussed by Beyer et al [20]. While this configuration is not the energetically most favored one, growth in MOVPE, however, takes place under highly nonequilibrium conditions and even energetically less favored states may result and be "frozen" in the following process (cf.…”
Section: B Experimentally Observed Gap/si(100) Interface Structuresmentioning
confidence: 97%
“…Recently, the atomic structure o f the GaP/Si(100) interface was investigated ex situ by transmission electron microscopy (TEM) and simplified abrupt interface structure models with either Si-Ga or Si-P interface bonds were proposed [20]. According to these models, Si-Ga bonds were formed during a pulsed nucleation starting with the P precursor at around 400 °C, while Si-P bonds were formed at elevated temperatures for the very first pulse.…”
Section: Or Pec Diodes By Metal-organic Vapor Phase Epitaxy (Movpe)mentioning
confidence: 99%
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“…It may also explain the Si−Ga bonds suggested recently. 17 We believe that the Si surface preparation step after Si buffer growth is decisive here for the amount of residuals found on the surface. Annealing at 730°C in 950 mbar H 2 after thermal deoxidation at 1000°C is crucial for single-domain, A-type surface preparation of Si(100) 2°.…”
mentioning
confidence: 99%
“…23 In section 2 we describe the computational methods employed. In section 3 we present the results from ab initio thermodynamics (AITD), explicit phonon (EP) and interpolated phonon (IP) computations, leading to a description of coverage dependence on temperature, which we compare to the experimental results described above.…”
Section: Introductionmentioning
confidence: 99%