2011
DOI: 10.1088/0268-1242/26/5/055021
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Gas-phase doping of silicon with sulfur

Abstract: The high-temperature gas-phase doping of silicon with sulfur has been studied at various sulfur vapor pressures. It is shown that the content of one-and two-atom sulfur-related deep donors in the semiconductor can be quantitatively controlled by varying the diffusant vapor pressure.

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Cited by 21 publications
(18 citation statements)
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“…We investigated the QZE in bulk-doped silicon with single substitutional donors Bi, Sb or P [35,36], the single interstitial donor Li, substitutional double donors S [37,38] and Se [33,39], the interstitial double donor Mg [40], and double donor complexes S 2 and Se 2 . The doping of each was in the range 1 × 10 14 −2 × 10 15 cm −3 , low enough that the distance between the donors is far larger than the orbit radius of any of the states of interest.…”
Section: Methodsmentioning
confidence: 99%
“…We investigated the QZE in bulk-doped silicon with single substitutional donors Bi, Sb or P [35,36], the single interstitial donor Li, substitutional double donors S [37,38] and Se [33,39], the interstitial double donor Mg [40], and double donor complexes S 2 and Se 2 . The doping of each was in the range 1 × 10 14 −2 × 10 15 cm −3 , low enough that the distance between the donors is far larger than the orbit radius of any of the states of interest.…”
Section: Methodsmentioning
confidence: 99%
“…From the latter it was possible to determine the concentration of the introduced deep donor Mg centers and their compensation by acceptors. The procedure is similar to that applied for the sulfur deep donor in Si [17] and includes fitting of the solution of the electroneutrality equation [18] to the set of Hall data points. Peculiarities of statistics of the n-type semiconductor doped with double donor deep impurity [19,20] were taken into account, when solving the electroneutrality equation.…”
Section: A Sample Preparationmentioning
confidence: 99%
“…At room temperature, due to thermal activation almost all centers are in a single positive charge state Mg + , while only a small fraction of them is in the double charged Mg ++ state. To convert the electron concentration profile obtained in the experiment into the distribution of magnesium, N Mg ( x ), we use the approach developed earlier to process the Hall effect data for the double‐charge donors. Namely, for each point of the profile of electron concentration, N Mg density is calculated.…”
Section: Temperature Dependence Of Magnesium Diffusion Coefficientmentioning
confidence: 99%
“…n‐Si with a resistivity of 8 × 10 3 Ω · cm has been used as an initial material. To find concentration of Mg i centers in the sample, the measured temperature dependence of concentration of free electrons n was processed using the statistics of an n‐type semiconductor doped with a double donor impurity; for details see .…”
Section: Volume‐doped Samples Prepared From Dislocation‐free Siliconmentioning
confidence: 99%