1993
DOI: 10.1007/bf00693444
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Ge-Au eutectic bonding of Ge {100} single crystals

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Cited by 3 publications
(2 citation statements)
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“…Therefore semiconductor interlayer bonding is promising to obtain Ge/Si wafers without an oxidation layer [11] in 400℃. Conventionally, the intermediate bonding layer consisting of gold-tin (Au-Sn) [12], gold-germanium (Au-Ge) [13] or gold-silicon (Au-Si) [14] is easy to realize eutectic bonding by change melt temperature. Thus far, this method is mainly used in hightemperature power devices [15], but not supportable for most optoelectronic devices [16,17] due to the high cost and thermo-compression process.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore semiconductor interlayer bonding is promising to obtain Ge/Si wafers without an oxidation layer [11] in 400℃. Conventionally, the intermediate bonding layer consisting of gold-tin (Au-Sn) [12], gold-germanium (Au-Ge) [13] or gold-silicon (Au-Si) [14] is easy to realize eutectic bonding by change melt temperature. Thus far, this method is mainly used in hightemperature power devices [15], but not supportable for most optoelectronic devices [16,17] due to the high cost and thermo-compression process.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the crystal-heatsink decoupling, g, was measured for each configuration of the heatsinking. 9 The maximum pulse height vs. bias for each thermistor was measured for a given heater energy deposition. By scaling pulse height by the energy deposition and the mass of the crystal on which the thermistor is mounted, the performance of thermistors attached to different devices can be compared.…”
Section: Ntd Thermistormentioning
confidence: 99%