Gear involute artifacts with sub-micron profile form deviations: manufacture and new design
Ming Ling,
Siying Ling,
Dianqing Yu
et al.
Abstract:Gear involute artifact (GIA) is a kind of calibration standard used for traceability of involute metrology. To machine GIAs with sub-micron profile form deviations, the effect on the involute profile deviations caused by the geometric deviations and 6-DoF errors of the machining tool based on the double roller-guide involute rolling generation mechanismwas analysed.At the same time, a double roller-guide involute lapping instrument and a lapping method for GIAs was proposed for lapping and in-situ measuring th… Show more
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