Generalized statistical dynamical theory of x-ray diffraction by imperfect multilayer crystal structures with defects

Olikhovskii, S. I.; Molodkin, V. B.; Len, E. G.; Skakunova, E. S.; Lizunova, S. V.

doi:10.1103/physrevb.99.235304

Cited by 5 publications

(4 citation statements)

References 71 publications

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“…It was described in detail in previous articles (see Molodkin et al, 2016;Olikhovskii et al, 2019). The distinction of this formula from the kinematical one is only that the 'red' divergence at k !…”

Section: Reciprocal-space Mapsmentioning

confidence: 99%

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Molodkin¹,

Olikhovskii²,

Dmitriev³

et al. 2021

Acta Cryst Sect A

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The analytical expressions for coherent and diffuse components of the integrated reflection coefficient are considered in the case of Bragg diffraction geometry for single crystals containing randomly distributed microdefects. These expressions are analyzed numerically for the cases when the instrumental integration of the diffracted X-ray intensity is performed on one, two or three dimensions in the reciprocal-lattice space. The influence of dynamical effects, i.e. primary extinction and anomalously weak and strong absorption, on the integrated intensities of X-ray scattering is investigated in relation to the crystal structure imperfections.

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Section: Reciprocal-space Mapsmentioning

confidence: 99%

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Molodkin¹,

Olikhovskii²,

Dmitriev³

et al. 2021

Acta Cryst Sect A

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“…RM(∆θ) is calculated using the recurrence relation between the amplitude reflection coefficients of two systems consisting of M and (M − 1) layers [49]:…”

Section: X-ray Diffraction By Quasi-monolayer Systemsmentioning

confidence: 99%

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

Skakunova

Olikhovskii

Radchenko

et al. 2023

Preprint

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We study the processes of dynamical diffraction on the graphene film/SiC substrate system. The statistical dynamical theory of X-ray diffraction in imperfect crystals is extended to the case of real quasi-two-dimensional systems. The necessity of the taking into account of the variability of the lattice parameter of multilayer graphene, as well as the influence of thickness on the thermal Debye–Waller factor at the calculation of the complex structural factors and Fourier components of polarizability, is demonstrated. It is shown that the change of the structural characteristics of the 3-layer graphene/substrate system, as well as its deformed state, leads to a significant change in the diffraction profiles, which makes it possible to determine the characteristics by the X-ray diffraction method.

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“…As mentioned, one of the effective methods of preparation graphene is its growth by annealing the SiC substrate. The analytical expressions for the intensity of diffracted X-ray radiation on the graphene film/SiC substrate system were used the recurrence relations between the coherent components of the amplitude reflection coefficients of adjacent layers 49 , which were obtained within the framework of the generalized dynamical theory of scattering in imperfect single crystals with randomly distributed defects 39 .…”

Section: X-ray Diffraction By Quasi-monolayer Systemsmentioning

confidence: 99%

“…R M (∆θ) is calculated using the recurrence relation between the amplitude reflection coefficients of two systems consisting of M and ( M − 1) layers 49 : where j = 1, …, M , R 0 ≡ r 0 , ∆θ is angular deviation of the crystal from the Bragg angle. r j and t j are the amplitude coefficients of reflection and transmission of the j th layer, respectively: where the index j indicates the connection of the corresponding value with the j th layer, b = γ 0 /|γ H | is the parameter of the diffraction asymmetry, γ 0 and γ H are the direction cosines of the wavevectors of the incident and diffracted plane waves, respectively, H is the reciprocal-lattice vector, K = 2π/λ, d j is the thickness of j th layer, δ = 1, 2.…”

Section: X-ray Diffraction By Quasi-monolayer Systemsmentioning

confidence: 99%

X-ray dynamical diffraction by quasi-monolayer graphene

Skakunova,

Olikhovskii,

Radchenko

et al. 2023

Sci Rep

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We study the processes of dynamical diffraction of the plane X-ray waves on the graphene film/SiC substrate system in the case of the Bragg diffraction geometry. The statistical dynamical theory of X-ray diffraction in imperfect crystals is applied to the case of real quasi-two-dimensional systems. The necessity of the taking into account of the variability of the lattice parameter of multilayer graphene, as well as the influence of thickness on the thermal Debye–Waller factor at the calculation of the complex structural factors and Fourier components of polarizability, is demonstrated. It is shown that the change of the structural characteristics of the 3-layer graphene/substrate system, as well as its strained state, leads to a significant change in the diffraction profiles, which makes it possible to determine the characteristics by the X-ray diffraction method.

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Generalized statistical dynamical theory of x-ray diffraction by imperfect multilayer crystal structures with defects

Cited by 5 publications

References 71 publications

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

X-ray dynamical diffraction by quasi-monolayer graphene

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