Generating Test Databases for Database-Backed Applications

Yan, Cong; Nath, Suman; Lu, Shan

doi:10.1109/icse48619.2023.00173

2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) 2023

DOI: 10.1109/icse48619.2023.00173

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Generating Test Databases for Database-Backed Applications

Cong Yan

Suman Nath

Shan Lu

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Generating Test Databases for Database-Backed Applications

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References 19 publications

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