2005
DOI: 10.1002/ejic.200500385
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Generation and Characterization of Multilayer Systems Consisting of Au55(PPh3)12Cl6 Double Layers and SiO2 Barrier Films

Abstract: Multilayer systems, consisting of Au55(PPh3)12Cl6 double layers and SiO2 barrier films of different thickness, have been generated and characterised. The formation of the double layer between the barrier films was carried out by using spin‐coating techniques. For the generation of the SiO2 films, a plasma‐assisted physical vapour deposition (PAPVD) procedure has been applied, based on an anodic plasma arc process. Samples of up to nine cluster/SiO2 combinations have been produced and have been characterised by… Show more

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Cited by 6 publications
(14 citation statements)
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“…The quality of the monolayers depends exclusively on the spin-coating conditions and the use of dichloromethane as solvent that has a distinct yield of moisture for improving the wetting conditions. [4] As an example of the successful generation of cluster/ SiO 2 multilayers, a transmission electron microscopic (TEM) image of a four-layered system is shown in Figure 3. As can be seen, the cluster monolayers are properly separated by the SiO 2 barrier films.…”
Section: Generation Of Cluster/sio 2 Multilayersmentioning
confidence: 99%
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“…The quality of the monolayers depends exclusively on the spin-coating conditions and the use of dichloromethane as solvent that has a distinct yield of moisture for improving the wetting conditions. [4] As an example of the successful generation of cluster/ SiO 2 multilayers, a transmission electron microscopic (TEM) image of a four-layered system is shown in Figure 3. As can be seen, the cluster monolayers are properly separated by the SiO 2 barrier films.…”
Section: Generation Of Cluster/sio 2 Multilayersmentioning
confidence: 99%
“…[4] For the current (I)-voltage (U) investigations we used a novel kind of contacting technique that is shown in Figure 1. A 1 × 1-cm 2 mica platelet was provided with a 0.5-mm borehole at the periphery (a).…”
Section: Generation Of Cluster/sio 2 Multilayersmentioning
confidence: 99%
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