The generation of charged nanoparticles was confirmed under typical conditions of the thin film deposition during the silicon chemical vapor deposition (CVD) process.To exert the electric force on these charged nanoparticles, the alternating current (ac) bias was applied to the stainless substrate holder during CVD. The bias frequency and voltage significantly affected the microstructure evolution and the growth rate. As the frequency at ±100 V was increased from 0.2 to 0.5, 1, and 5 Hz, the mass of the film became respectively 1.1, 2.2, 3.0, and 3.5 times compared with that of the film deposited under the zero bias. As the bias voltage at 1 Hz was increased from 0 to ±50, ±100, ±150, and ±200 V, the mass was increased respectively by 1.8, 3, 4.5, and 8.5 times.