1994
DOI: 10.1143/jjap.33.2200
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Generation of Electron Cyclotron Resonance Neutral Stream and Its Application to Si Etching

Abstract: A low-energy (10–20 eV) neutral stream generated by charge exchange reactions in an electron cyclotron resonance (ECR) plasma stream is extracted by eliminating charged particles and used for Si etching. The formation of a cusp magnetic field over the substrate eliminates charged particles because electrons are led outside the substrate by the magnetic field. In addition, residual ions are repelled by a positive voltage supplied to the substrate, and it becomes possible to irradiate the etching samples… Show more

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Cited by 19 publications
(17 citation statements)
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“…Recently, we showed that charged particles could be eliminated by using a magnetic field and succeeded in extracting only the neutral species. 13,14 We used the extracted energetic neutral species, which we call a ''neutral stream,'' for Si etching. We found that neutral stream etching with Cl 2 and SF 6 provided anisotropic etching profiles.…”
Section: Kinetic-energy Measurement Of a Neutral Stream Extracted Fromentioning
confidence: 99%
“…Recently, we showed that charged particles could be eliminated by using a magnetic field and succeeded in extracting only the neutral species. 13,14 We used the extracted energetic neutral species, which we call a ''neutral stream,'' for Si etching. We found that neutral stream etching with Cl 2 and SF 6 provided anisotropic etching profiles.…”
Section: Kinetic-energy Measurement Of a Neutral Stream Extracted Fromentioning
confidence: 99%
“…This so-called neutral beam etching ͑NBE͒ has been the subject of continuing research. [6][7][8][9][10][11][12] To make NBE practical on an industrial scale, the energy and flux of the fast neutrals need to be comparable to those of ions in reactive ion etching. To obtain a high flux of fast neutrals, Panda et al 13 and Samukawa et al [14][15][16] have used high density inductively coupled plasmas ͑ICP͒.…”
Section: Introductionmentioning
confidence: 99%
“…We assume the ionization is caused by electron impact ionization and neglect recombination. Thus S = ß(T e )nN = co(T e )n (3) where N is the background neutral density, and ß is the average of the ionization cross section times the electron velocity. The force equation comes from taking the total momentum equation (electron plus ion, but neglecting electron inertia) and subtracting u times the density equation.…”
Section: A Quasi-neutral Ecr Plasma Nozzlementioning
confidence: 99%
“…The two applications which we have in mind are plasma processing with a stream of neutrals [3,4], and space propulsion (i.e. a plasma thruster) [5].…”
Section: Introductionmentioning
confidence: 99%