2012
DOI: 10.1002/rcm.6137
|View full text |Cite
|
Sign up to set email alerts
|

Generation of negative ions from SF6 gas by means of hot surface ionization

Abstract: Negative surface ionization on the hot filament is a relatively simple and effective method for carrying out negative ion formation studies. Eight SF(6) decomposition channels leading to the formation of negative ions have been detected and analyzed using this technique.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

3
37
0
3

Year Published

2012
2012
2020
2020

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 20 publications
(43 citation statements)
references
References 17 publications
(67 reference statements)
3
37
0
3
Order By: Relevance
“…The vertical axes are electron intensities in arbitrary units from NPES or PD, log [electron intensities], the derivatives, d[NPES)] and the log [d(NPES)]. The plots clearly support multiple states reported using the NSI data from Pelc . Most significant is the 1.7 eV structure at the electron affinity reported in January 2015 …”
Section: Discussionsupporting
confidence: 76%
See 3 more Smart Citations
“…The vertical axes are electron intensities in arbitrary units from NPES or PD, log [electron intensities], the derivatives, d[NPES)] and the log [d(NPES)]. The plots clearly support multiple states reported using the NSI data from Pelc . Most significant is the 1.7 eV structure at the electron affinity reported in January 2015 …”
Section: Discussionsupporting
confidence: 76%
“…. The 2012 negative surface ionization, NSI, data reported by Pelc for SF 6 , SF 5 , SF 4 and F are the only mass‐analyzed data for electron attachment to SF 6 at temperatures above 1000K …”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…. We determined the AE a values: (eV) SF 6 , 3.0(1); SF 5 , 3.85(2); SF 4 , 2.7(1) from the decrease in the NSI data at temperatures above 2470 K . Here, we predict multiple AE a (SF n ) values (n = 1 to 6), given in Fig.…”
mentioning
confidence: 95%