Proceedings of the 1997 ACM Fifth International Symposium on Field-Programmable Gate Arrays - FPGA '97 1997
DOI: 10.1145/258305.258333
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Generation of synthetic sequential benchmark circuits

Abstract: Programmable logic architectures increase in capacity before commercial circuits are designed for them, yielding a distinct problem for FPGA vendors: how to test and evaluate the effectiveness of new architectures and software. Benchmark circuits are a precious commodity, and often cannot be found at the correct granularity, or in the desired quantity.In previous work, we haue defined important physical characteristics of combinational circuits.We presented a tool (cmc) to extract them, and gaue an algorithm… Show more

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Cited by 25 publications
(53 citation statements)
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“…These come from three sources, two of which are the MCNC suite [Yanggl], and the RAW benchmark suite [Babb97]. Since we are principally interested in large circuits, we also used the synthetic benchmark circuit generator developed at the University of Toronto [Hutt97] to create several very large benchmarks. Although the latter circuits are actually somewhat more difficult than real circuits, we believe they are perfectly reasonable test cases for the compile time issue.…”
Section: Difficulty Predictionmentioning
confidence: 99%
“…These come from three sources, two of which are the MCNC suite [Yanggl], and the RAW benchmark suite [Babb97]. Since we are principally interested in large circuits, we also used the synthetic benchmark circuit generator developed at the University of Toronto [Hutt97] to create several very large benchmarks. Although the latter circuits are actually somewhat more difficult than real circuits, we believe they are perfectly reasonable test cases for the compile time issue.…”
Section: Difficulty Predictionmentioning
confidence: 99%
“…These benchmarks are from the MCNC suite [26], the RAW benchmark suite [4], and a benchmark circuit generator [18]. All experiments were run on a 366MHz Celeron-based PC with 256MB of memory.…”
Section: Resultsmentioning
confidence: 99%
“…For this reason, the first successful trials of benchmark generation were based on applying a sequence of random transformations on an initial (existing) circuit [4, 51. Hutton et al [6] addressed the problem of random generation of circuits "from scratch". They defined properties such as size, delay, physical shape, edge-length distribution, and fanout distribution to describe the physical characteristics and generated circuits with an exact parameterization ("clones" of existing circuits).…”
Section: Introductionmentioning
confidence: 99%