“…In previous reports on multicomponent PVD glasses, ellipsometric data have only been utilized to characterize kinetic stability; no previous reports provide density measurements for multicomponent PVD glasses. In contrast, for single component PVD glasses, in situ ellipsometry has frequently been employed for detecting the kinetic stability and density increases for as-deposited thin glassy films, in comparison to liquid cooled glasses. ,− ,,,, In our experience using ellipsometry to study other pairs of organic semiconductors, , we have observed that the onset temperature was reproducible, while the relative density was not. We assume that this somehow results from the failure of the ellipsometric model for multi component films.…”