Genesys-pro: innovations in test program generation for functional processor verification

Adir, Allon; Almog, Eli; Fournier, Laurent Sébastien; Marcus, Eitan; Rimon, Michal; Vinov, Michael; Ziv, Avi

doi:10.1109/mdt.2004.1277900

Cited by 153 publications

(66 citation statements)

References 12 publications

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“…IBM Research [3,5,6] has been one of the main contributors in the field of test program generation for microprocessors during the last decades. The first test generation tools were developed in the middle of 1980s.…”

Section: Related Work and Motivationmentioning

confidence: 99%

“…To cover nontrivial cases that are unreachable by using random and combinatorial generation, a test generation tool should be strengthened to be able to create directed tests [3]. Directed tests are usually generated on the basis of test templates that provide abstract high-level descriptions of testing problems.…”

Section: Introductionmentioning

confidence: 99%

“…In fact, this could be improved as constraints for similar verification tasks tend to share common parts. The next step in the evolution of approaches to test generation is model-based generation [1,2,3]. It implies separation of knowledge of the verified system's configuration from knowledge of test generation techniques.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A Generic Knowledgebase for Test Generation

Kotsynyak¹,

Tatarnikov²

2014

Proceedings of the Spring/Summer Young Researchers' Colloquium on Software Engineering

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Abstract-Nowadays a lot of various test generation tools are developed and applied to create tests for both software applications and hardware designs. Taking into account the size and complexity of modern projects, there is an urgent need for "smart" tools that would help maximize test coverage and keep the required effort and time to a minimum. Despite the fact that each project is unique in some sense, there is a set of common generation techniques that are applied in a wide range of projects (random tests, combinatorial tests, tests for corner cases, etc). In addition, projects belonging to specific domains tend to share similar test cases or use similar heuristics to generate them. A natural way to improve the quality of testing is to make the most of the experience gained working on different projects or performing testing at different stages of the same project. To achieve this goal, a knowledgebase holding information relevant to test generation would be of a great help. This would facilitate reuse of test cases and generation algorithms and would allow sharing knowledge of "interesting" situations that can occur in a system under test. The paper proposes a concept of a knowledgebase for test generation that can be used in a wide range of test generation tools. At ISPRAS, it is applied in test program generation tools that create test programs for microprocessors. The knowledgebase is designed to store information on widely used test generation techniques and test situations that can occur in a microprocessor design under verification.

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Section: Related Work and Motivationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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A Generic Knowledgebase for Test Generation

Kotsynyak¹,

Tatarnikov²

2014

Proceedings of the Spring/Summer Young Researchers' Colloquium on Software Engineering

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“…It is typical that up to half of resources spent on microprocessor design is devoted to verification. The most common approach to verification of microprocessors at a core level is test program generation (TPG) [1]. Test programs (TPs) are instruction sequences that trigger device events and optionally check validity of the resulting state of the microprocessor.…”

Section: Introductionmentioning

confidence: 99%

“…That is usually called model-based TPG [1]. Platform-dependent knowledge includes mainly an instruction set model (ISM) and testing knowledge (TK), a collection of design-specific test situations (conditions to be covered by tests).…”

Section: Introductionmentioning

confidence: 99%

MicroTESK: An ADL-Based Reconfigurable Test Program Generator for Microprocessors

Kamkin¹,

Tatarnikov²

2012

Proceedings of the Spring/Summer Young Researchers' Colloquium on Software Engineering

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Abstract-Test program generation plays a major role in functional verification of microprocessors. Due to tremendous growth in complexity of modern designs and rigid constraints on time to market, it becomes an increasingly difficult task. In spite of powerful test program generators available in the market, development of functional tests is still known to be the bottleneck of the microprocessor design cycle. The common problem is that it takes significant effort to reconfigure a test program generation tool for a new microprocessor design. The modelbased approach applied in the state-of-the-art tools, like GenesysPro, still does not provide enough flexibility since creating a microprocessor model is difficult and requires special knowledge and skills. The article suggests an approach to ease generator customization by using architecture specifications that describe the microprocessor behavior at a higher level. The approach is aimed at facilitating development of architecture models and, thus, minimizing time required to create functional tests. At the moment, we are working to implement a new generation of the test program generator MicroTESK that can be easily configured for various microprocessor architectures.

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Random Stimuli Generation for Functional Hardware Verification as a CP Application

Naveh

Emek

2005

Principles and Practice of Constraint Programming - CP 2005

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Genesys-pro: innovations in test program generation for functional processor verification

Cited by 153 publications

References 12 publications

A Generic Knowledgebase for Test Generation

A Generic Knowledgebase for Test Generation

MicroTESK: An ADL-Based Reconfigurable Test Program Generator for Microprocessors

Random Stimuli Generation for Functional Hardware Verification as a CP Application

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