Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

Golonek, T.; Rutkowski, Jerzy

doi:10.1109/tcsii.2006.884112

Cited by 110 publications

(91 citation statements)

References 14 publications

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“…They allow arranging different tests, e.g. on the basis of Table 8 the tests can be created in the circuit supplied with the sources of the set B (6) by measurement of the voltages at three nodes from among the nodes 6, 7, 8, 9 or at two of these nodes and voltage measurement at node 9 in the circuit driven by the sources of set B (9) . …”

Section: Examplementioning

confidence: 99%

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A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Tadeusiewicz

Hałgas

2017

J Electron Test

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The paper deals with multiple soft fault diagnosis of linear analog circuits. The basic problem of arranging diagnostic tests performed in DC or AC states is considered in detail. A systematic method is developed that allows finding values of the sources applied to the excitation nodes as well as the measurement nodes at which the voltage variations due to the parameter deviations are sufficiently large. For this purpose the sensitivity analysis and the nonlinear programming technique, with appropriate objective function and constraints, are used. Four numerical examples reveal effectiveness of the proposed method for arranging the diagnostic tests.

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Section: Examplementioning

confidence: 99%

“…To determine the optimal set of the test points required by the dictionary approach, different tools have been proposed, e.g. evolutionary computations [6] and fault-pair isolation tables [24]. A method for selection of optimal test frequencies, used by soft and hard fault diagnoses, is developed in reference [22].…”

Section: Introductionmentioning

confidence: 99%

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Tadeusiewicz

Hałgas

2017

J Electron Test

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“…In [11,19,35], there are the techniques that use support vector machines for faults detection. Heuristic computations and statistical analysis are used in [4,[6][7][8]13,18,20] for catastrophic and global parametric faults detection as well as for optimal test points and testing signal shape searching, respectively. In [34], the entropy parameter is used to analog circuit soft faults detections.…”

Section: Introductionmentioning

confidence: 99%

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Golonek

Machniewski

2017

Circuits Syst Signal Process

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This paper describes an approach for an analog electronic circuit specification quick verification that is based on a simple mathematical model determined during the before-test stage statistical analysis. Generally, the observed performance parameters (e.g., cutoff frequency, phase shift at the assumed frequency point) are calculated from the Walsh-Hadamard transform components of circuit under test step time response. The optimal estimating formulas for relationship between the tested specifications and the selected components of the spectra are defined in the system based on a linear multiple regression procedure supported by genetic programming. The evolutionary computations significantly improve the approximation effectiveness by selecting the most representative points of the sequences domain and by defining the optimal set of linearizing functions. Finally, at the test stage, only a simple step stimulus and time-effective calculations are required to the tested performance parameters (specifications) of analog circuit identification and it predisposes the approach to quick production testing procedure realization or to embedding it in the mixed-signal systems. The automated built-in self-testing procedure using this concept may be easily implemented to low-cost microcontroller equipped with AD converter used for the testing response samples acquiring.

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“…Analogue circuit testing and diagnosing are necessary to achieve high quality and reliability of analogue systems and to control their production yield [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. The diversity of analogue signals, noise presence, the limited accuracy of test measurements, circuit parameters' tolerance dispersions and simulation models inaccuracies are exemplary difficulties which are reasons of the complexity of analogue circuit testing [1].…”

Section: Introductionmentioning

confidence: 99%

Stimulus with Limited Band Optimization for Analogue Circuit Testing

Golonek¹,

Jantos²,

Rutkowski³

2012

Metrology and Measurement Systems

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The paper presents an analogue circuit testing method that engages the analysis of the time response to a nonperiodic stimulus specialized for the verification of selected specifications. The decision about the current circuit diagnostic state depends on an amplitude spectrum decomposition of the time response measured during the test. A shape of the test excitation spectrum is optimized with the use of a differential evolution algorithm and it allows for achieving maximum fault coverage and the optimal conditions for fault isolation. Genotypes of the evolutionary system encode the amplitude spectrum of candidates for testing stimuli by means of rectangle frequency windows with amplitudes determined evolutionarily.

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Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

Cited by 110 publications

References 14 publications

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Stimulus with Limited Band Optimization for Analogue Circuit Testing

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