2013
DOI: 10.1063/1.4834518
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Geometric factors in the magnetoresistance of n-doped InAs epilayers

Abstract: We investigate the magnetoresistance (MR) effect in n-doped InAs and InAs/metal hybrid devices with geometries tailored to elucidate the physical mechanism and the role of geometry in the MR. Despite the isotropic Fermi surface in InAs, we observe a strong intrinsic MR in the InAs epilayer due to the existence of a surface conducting layer. Experimental comparison confirms that the extraordinary MR in the InAs/metal hybrids outperforms the orbital MR in the Corbino disk in terms of both the MR ratio and the ma… Show more

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Cited by 11 publications
(7 citation statements)
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“…The magnetoresistance attains 491% at 2.1T and still tends to rise with the increase of the magnetic field. This result is comparable to other researches on Corbino magnetoresistance for magnetic and nonmagnetic materials . We attribute this phenomenon to the increase of photoinduced carriers and the bending of their diffusion path.…”
Section: Introductionsupporting
confidence: 90%
“…The magnetoresistance attains 491% at 2.1T and still tends to rise with the increase of the magnetic field. This result is comparable to other researches on Corbino magnetoresistance for magnetic and nonmagnetic materials . We attribute this phenomenon to the increase of photoinduced carriers and the bending of their diffusion path.…”
Section: Introductionsupporting
confidence: 90%
“…The magnitude of the magnetic force on the moving carrier is governed by its drift velocity in the electric field. Therefore, the size of the magnetic deflection, and resulting resistance change, can be used to infer carrier mobility [48][49][50] . This approach is commonly used to characterise the mobility active in short channel device geometries, where the sample is much wider than it is long [51][52][53][54][55] (𝑙/𝑤 ≪ 1, where 𝑙 is the length between current carrying electrodes and 𝑤 is the channel width).…”
Section: Lno Domain Walls As Corbino Conesmentioning
confidence: 99%
“…Therefore, the size of the magnetic deflection, and resulting resistance change, can be used to infer carrier mobility. [48][49][50] This approach is commonly used to characterize the mobility active in short-channel device geometries, where the sample is much wider than it is long [51][52][53][54][55] (l/w ≪ 1, where l is the length between current carrying electrodes and w is the channel width). In this geometry, known as the "short Hall bar," many carriers, which are deflected by a Lorentz force, reach the sink electrode before encountering a sample boundary.…”
Section: Lno Domain Walls As Corbino Conesmentioning
confidence: 99%
“…These materials include indium antimonide (InSb) [1][2][3] and indium arsenide (InAs) [4] whose mobility could be beyond 1 m 2 /V s. In these materials, Lorentz force governs OMR. According to Onsager relation [5], the maximum OMR is (μB) 2 at small field of B 5μ À 1 and saturates at high field.…”
Section: Introductionmentioning
confidence: 99%