This paper puts forward a novel method for measuring the thin period-structure-film thicknesses based on the Bloch surface wave (BSW) enhanced Goos-Hänchen (GH) shift in one-dimensional photonic crystal (1DPC). The BSW phenomenon presented in 1DPC enhances the GH shift generated in the attenuated total internal reflection structure. The GH shift is closely related to the thickness of the film which composed by layer-structure of 1DPC. GH shifts in multiple different incident light conditions will be obtained by varying the wavelength and angle of the measured light, and the thickness distributions of the entire structure of 1DPC will be calculated by the Particle Swarm Optimization (PSO) algorithm. The relationship, between the structure of a 1DPC film composed of TiO2 and SiO2 layers and the GH shift, is specially investigated. Under the specific photonic crystal structure and incident conditions, a giant GH shift, 5.1 × 103 times of the wavelength of incidence, can be obtained theoretically. Simulation and calculation results show that it is capable to measure the thicknesses of termination layer and periodic structure layers of 1DPC films with 0.1 nm resolution by measuring the GH shifts. The exact structure of a 1DPC film is innovatively measured by the BSW enhanced GH shift.