Giant magnetoresistance in electrodeposited superlattices

Alper, Mürsel; Attenborough, K.; Hart, R. C.; Lane, S. J.; Lashmore, D.S.; Younes, C.M.; Schwarzacher, Walther

doi:10.1063/1.110567

Cited by 153 publications

(60 citation statements)

References 10 publications

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“…Multilayer nanowires can also be fabricated in an electrolytic bath containing all the elements to be deposited (Blondel et al, 1994;Piraux et al, 1994). In this case, the potential is alternated between two values, where the deposition of each material is favoured for one value of potential (Alper et al, 1993) (Fig. 12b).…”

Section: Fabrication Of Nanowire Arraysmentioning

confidence: 99%

Extracting Individual Properties from Global Behaviour: First-order Reversal Curve Method Applied to Magnetic Nanowire Arrays

Béron¹,

Carignan²,

Ménard³

et al. 2010

Electrodeposited Nanowires and Their Applications

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Section: Fabrication Of Nanowire Arraysmentioning

confidence: 99%

Extracting Individual Properties from Global Behaviour: First-order Reversal Curve Method Applied to Magnetic Nanowire Arrays

Béron¹,

Carignan²,

Ménard³

et al. 2010

Electrodeposited Nanowires and Their Applications

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“…1,2 Multilayers are mostly produced by physical methods ͑evaporation, sputtering, and molecular beam epitaxy͒, some of them applying a fairly expensive high vacuum system. The feasibility of the electrodeposition of metallic magnetic/ nonmagnetic multilayers with GMR was demonstrated 3 a few years after the discovery of the phenomenon. Although electrodeposition has long been considered as a possible low cost alternative to the physical sample preparation techniques, the quality of the electrodeposited ͑ED͒ multilayers is still inferior to their physically produced analogs.…”

mentioning

confidence: 99%

Application of Surface Roughness Data for the Evaluation of Depth Profile Measurements of Nanoscale Multilayers

Bartok

Csík

Vad

et al. 2009

J. Electrochem. Soc.

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A secondary neutral mass spectrometric ͑SNMS͒ depth profile study of electrodeposited Co/Cu multilayers was performed. Depth profile measurements were performed both in the conventional way ͑i.e., starting the sputtering from the final deposit surface͒ and in the reverse manner ͑i.e., detaching the multilayers from the substrate and starting the analysis from the substrate side, which was very smooth as compared to the final deposit surface͒. The latter method could yield significantly larger intensity fluctuations in the SNMS spectra. Surface roughness data were measured with atomic force microscopy ͑AFM͒ for multilayers with different bilayer numbers but otherwise exhibiting the same layer structure as those used for the depth profiling. The experimental AFM surface roughness evolution was used to calculate the result of the depth profile measurements quantitatively. An excellent agreement was obtained between this calculation and the SNMS measurements. It was shown that the decrease in the intensity fluctuations during the depth profile analysis stems mainly from the increase in surface roughness of the samples studied, especially in the conventional sputtering mode. It was also concluded that the thickness fluctuation of the entire multilayer deposit and that of each layer are strongly correlated. DOI: 10.1149/1.3133182 .Nanoscale magnetic/nonmagnetic multilayers are in the forefront of materials research since the discovery of giant magnetoresistance ͑GMR͒ in these nanostructures.1,2 Multilayers are mostly produced by physical methods ͑evaporation, sputtering, and molecular beam epitaxy͒, some of them applying a fairly expensive high vacuum system. The feasibility of the electrodeposition of metallic magnetic/ nonmagnetic multilayers with GMR was demonstrated 3 a few years after the discovery of the phenomenon. Although electrodeposition has long been considered as a possible low cost alternative to the physical sample preparation techniques, the quality of the electrodeposited ͑ED͒ multilayers is still inferior to their physically produced analogs. The literature of the ED multilayer films with GMR amounts to some 140 papers, 4-6 but very little is known about why the sample quality, especially GMR, cannot achieve the properties of the samples prepared by physical methods.Although depth profile analysis is a very efficient tool for the characterization of element distribution and the interface quality of ED multilayer samples, only a few studies were published hitherto. Basile et al.7 studied the depth profile of ED Co/Cu sandwiches by Auger electron spectroscopy. They found that the observed interface width of approximately 20 nm is an inherent feature of the sample itself rather than the artifact of the sputtering method used for the depth profiling ͑although the sputtering also leads to some intermixing at a smaller depth scale 8,9 ͒. According to Tokarz et al., 10 the interface width of ED Cu͑200 nm͒/Ni͑200 nm͒ bilayers can also be estimated as being 20-30 nm, as shown by their secondary-ion mass spe...

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“…Since during the MR measurements a constant current passes through the film plane, this kind of GMR is called current-in-plane GMR (CIP-GMR) [11]. We reported CIP-GMR values of up to $25% at room temperature for electrodeposited Cu/Co-Ni-Cu multilayered thin films with Cu layers as thin as $0.7 nm and Co:Ni ratio of 3:1 [10,12].…”

Section: Introductionmentioning

confidence: 90%

Fabrication and magnetic study of Co/Pt multilayer nanowires and Co–Pt alloy nanowires electrodeposited into porous Si substrates

Nabiyouni

Hedayati

2012

Journal of Experimental Nanoscience

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In this work, we grow composite structures consisting of magnetic and non-magnetic metal or alloy nanowires electrodeposited into the ion etched tracks previously created inside Si substrates. The holes are then filled by Co-Pt alloys and Co/Pt multilayers using electrodeposition technique making a large number of parallel nanowires. This process takes place in a single electrolyte containing Co þ2 and Pt þ4 ions by applying a proper deposition potential using a computer control potentiostat. The magnetic properties of the sample were studied using vibrating sample magnetometer. Magnetoresistive behaviour of the nanowire samples was then studied by subjecting the samples to an external magnetic field. The results show that the Co/Pt multilayered nanowires exhibit a large magnetoresistance, while the Co-Pt alloys only show anisotropic magnetoresistance. This result could be of a great interest for the sensor fabrication community as they will provide a view on a very important direction of the development of the wide spread sensor industry, and more importantly for understanding the physical phenomena underlying the magnetic/non-magnetic nanostructures.

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Giant magnetoresistance in electrodeposited superlattices

Cited by 153 publications

References 10 publications

Extracting Individual Properties from Global Behaviour: First-order Reversal Curve Method Applied to Magnetic Nanowire Arrays

Extracting Individual Properties from Global Behaviour: First-order Reversal Curve Method Applied to Magnetic Nanowire Arrays

Application of Surface Roughness Data for the Evaluation of Depth Profile Measurements of Nanoscale Multilayers

Fabrication and magnetic study of Co/Pt multilayer nanowires and Co–Pt alloy nanowires electrodeposited into porous Si substrates

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