GISAXS and GISANS as metrology technique for understanding the 3D morphology of block copolymer thin films

Müller‐Buschbaum, Peter

doi:10.1016/j.eurpolymj.2016.04.007

Cited by 79 publications

(68 citation statements)

References 138 publications

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“…Grazing-incidence small-angle X-ray scattering70 measurements were performed at the 11-ID CHX (Coherent Hard X-ray) beamline of the National Synchrotron Light Source II, at Brookhaven National Laboratory. Samples were measured under vacuum using an X-ray beam of 8.8984, keV ( λ =0.1393, nm).…”

Section: Methodsmentioning

confidence: 99%

Non-native three-dimensional block copolymer morphologies

et al. 2016

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Self-assembly is a powerful paradigm, wherein molecules spontaneously form ordered phases exhibiting well-defined nanoscale periodicity and shapes. However, the inherent energy-minimization aspect of self-assembly yields a very limited set of morphologies, such as lamellae or hexagonally packed cylinders. Here, we show how soft self-assembling materials—block copolymer thin films—can be manipulated to form a diverse library of previously unreported morphologies. In this iterative assembly process, each polymer layer acts as both a structural component of the final morphology and a template for directing the order of subsequent layers. Specifically, block copolymer films are immobilized on surfaces, and template successive layers through subtle surface topography. This strategy generates an enormous variety of three-dimensional morphologies that are absent in the native block copolymer phase diagram.

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Section: Methodsmentioning

confidence: 99%

Non-native three-dimensional block copolymer morphologies

et al. 2016

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“…The interaction of X-rays with scattering domains inside the film is simulated by form and structure factors that translate to domain shapes and their distances in real space. [17][18][19][20] Grazing-incidence wide angle X-ray scattering (GIWAXS) probes length scales down to the atomic range and thus yields crystallographic information about the crystalline part of the sample. Reflexes in the scattering pattern stem from crystal planes denoted in the reciprocal lattice by Miller indices (hkl) and give information about crystal phase and orientation with respect to the substrate surface normal.…”

Section: Research Newsmentioning

confidence: 99%

Structure of Organometal Halide Perovskite Films as Determined with Grazing‐Incidence X‐Ray Scattering Methods

Schlipf

Müller‐Buschbaum

2017

Advanced Energy Materials

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Grazing‐incidence X‐ray scattering (GIXS) methods have proven to be a valuable asset for investigating the morphology of thin films at different length scales. Consequently, GIXS has been applied to the fast‐progressing field of organometal halide perovskites. This exciting class of materials has propelled research in the areas of cheap and sustainable photovoltaics, light emitting devices, and optoelectronics in general. Especially, perovskite solar cells (PSC) have seen a remarkable rise in power conversion efficiencies, crossing the 20% mark after only five years of research. This research news outlines GIXS studies focusing on the most challenging research topics in the perovskite field today: Current–voltage hysteresis, device reproducibility, and long‐term stability of PSC are inherently linked to perovskite film morphology. On the other hand, film formation depends on the choice of precursors and processing parameters; understanding their interdependence opens possibilities to tailor film morphologies. Owing to their tunability and moisture resistance, 2D perovskites have recently attracted attention. Examples of GIXS studies with different measurement and data analysis techniques are presented, highlighting especially in‐situ investigations on the many kinetic processes involved. Thus, an overview on the toolbox of GIXS techniques is linked to the specific needs of research into organometal halide perovskite optoelectronics.

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“…Some of the earlier OFFSpec and GISANS experiments are summarized in the short review by Dalgliesh [33] and Hamilton [34], respectively. A more recent review discusses the use of GISAXS and GISANS for the study of block copolymer thin films [35] and a paper by Lauter et al evaluates the power of so called complete reflectometry experiments evaluating NR, OFFSpec and GISANS [36,37] The low absorption of neutrons can be used to probe not only the reflected but also transmitted (Laue EPJ Web of Conferences 188, 04002 (2018) https://doi.org/10.1051/epjconf/201818804002 JDN 23 scattering) intensity measuring below the samples horizon. This offers the opportunity to access a wide range of Q values [38], e.g.…”

Section: Examplesmentioning

confidence: 99%

Grazing incidence scattering

Wolff

2018

EPJ Web of Conferences

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Reflectometry experiments probe the scattering length density along the normal of interfaces by analysing the specularly scattered intensity. Lateral fluctuations result in intensity scattered away from the specular condition. In this paper the principles and peculiarities of grazing incidence scattering experiments are explained. One specific example, the self assembly of polymer micelles close to interfaces, is taken as a show case in order to introduce the scattering geometry and accessible length scales. The basic idea of the distorted wave Born approximation is lined out and some scientific examples are summarized.

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GISAXS and GISANS as metrology technique for understanding the 3D morphology of block copolymer thin films

Cited by 79 publications

References 138 publications

Non-native three-dimensional block copolymer morphologies

Non-native three-dimensional block copolymer morphologies

Structure of Organometal Halide Perovskite Films as Determined with Grazing‐Incidence X‐Ray Scattering Methods

Grazing incidence scattering

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