“…The XRD analysis demonstrates the temperaturedependent crystallization of ITO films, as displayed in Figure 8. The peaks at around 2θ = 21.49 • , 30.57 • , and 51.00 • correlated with (2,1,1), (2,2,2), and (4,4,0) crystal structure plan of In 2 O 3 [21][22][23][24]. The intensity of the (2,2,2) XRD diffraction peak of ITO films increase with an increase of post anneal temperature.…”