Global parametric faults identification with the use of Differential Evolution

Jantos, P.; Grzechca, Damian; Rutkowski, Jerzy

doi:10.1109/ddecs.2009.5012133

Cited by 3 publications

(3 citation statements)

References 2 publications

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“…Only a few papers discuss the global parametric fault diagnosis. To tackle that problem the nonlinear regression modeling techniques [5], the artificial neural network [13], and the differential evolution [14] were used. A new approach to the problem of global fault diagnosis is proposed in reference [31], based on the homotopy concept and the simplicial method [9].…”

Section: Global Fault Diagnosis Of Analog Cmos Circuits Manufacturmentioning

confidence: 99%

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

Tadeusiewicz

Hałgas

Kuczyński

2015

International Journal of Electronics and Telecommunications

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The paper is focused on nonlinear analog circuits, with the special attention paid to circuits comprising bipolar and MOS transistors manufactured in micrometer and submicrometer technology. The problem of fault diagnosis of this class of circuits is discussed, including locating faulty elements and evaluating their parameters. The paper deals with multiple parametric fault diagnosis using the simulation after test approach as well as detection and location of single catastrophic faults, using the simulation before test approach. The discussed methods are based on diagnostic test, leading to a system of nonlinear algebraic type equations, which are not given in explicit analytical form. An important and new aspect of the fault diagnosis is finding multiple solutions of the test equation, i.e. several sets of the parameters values that meet the test. Another new problems in this area are global fault diagnosis of technological parameters in CMOS circuits fabricated in submicrometer technology and testing the circuits having multiple DC operating points. To solve these problems several methods have been recently developed, which employ different concepts and mathematical tools of nonlinear analysis. In this paper they are sketched and illustrated. All the discussed methods are based on the homotopy (continuation) idea. It is shown that various versions of homotopy and combinations of the homotopy with some other mathematical algorithms lead to very powerful tools for fault diagnosis of nonlinear analog circuits. To trace the homotopy path which allows finding multiple solutions, the simplicial method, the restart method, the theory of linear complementarity problem and Lemke’s algorithm are employed. For illustration four numerical examples are given

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Section: Global Fault Diagnosis Of Analog Cmos Circuits Manufacturmentioning

confidence: 99%

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

Tadeusiewicz

Hałgas

Kuczyński

2015

International Journal of Electronics and Telecommunications

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“…Only a few papers discuss the global parametric fault diagnosis. To tackle that problem, the nonlinear regression modeling techniques , the artificial neural network and the differential evolution were used.…”

Section: Introductionmentioning

confidence: 99%

Global and local parametric diagnosis of analog short‐channel CMOS circuits using homotopy‐simplicial algorithm

Tadeusiewicz

Hałgas

2013

Circuit Theory & Apps

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SUMMARY The paper offers an algorithm for local and global parametric diagnosis in nonlinear analog circuits, including both identification of the faulty parameters and determination their values. The algorithm exploits a nonlinear algebraic type test equations which may possess multiple solutions, corresponding to different sets of the parameters values which meet the test. To find the solutions, the homotopy concept is applied. Since the test equation is not given in explicit analytical form, the simplicial method is used to trace the homotopy path. The proposed approach can be applied to a broad class of analog circuits, including the complementary metal–oxide–semiconductor circuits fabricated in nanometer technology. The developed diagnostic procedure has been implemented in DELPHI, whereas the required by the algorithm repeated circuit analyses are carried out using IsSPICE 4 and both environments have been joined together. For illustration, two numerical examples are given. Copyright © 2013 John Wiley & Sons, Ltd.

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“…Artificial neural network (ANN) has been utilized for information processing and GPF identification. The presented method requires fault simulation at the before test stage [1], [5], [6]. ANN outputs are defined by their activation functions (transfer functions).…”

Section: Introductionmentioning

confidence: 99%

A global parametric faults diagnosis with the use of artificial neural networks

Jantos

Grzechca

Rutkowski

2009

2009 European Conference on Circuit Theory and Design

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A method of a global parametric faults diagnosis in analogue integrated circuits is presented in this paper. The method is based on basic features calculated from a circuit's under test time domain response to a voltage step, i.e. locations of maxima and minima of circuit under test response and its first order derivative. The testing and diagnosis process is executed with the use of an artificial neural network. The neural network is supplied with extracted basic features. After evaluation and discrimination, the neural network outputs indicate the circuit state. The proposed diagnosis method has been verified with the use of exemplary integrated circuits -an operation amplifier µA741 and an integrated band-pass filter.

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Global parametric faults identification with the use of Differential Evolution

Cited by 3 publications

References 2 publications

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

Global and local parametric diagnosis of analog short‐channel CMOS circuits using homotopy‐simplicial algorithm

A global parametric faults diagnosis with the use of artificial neural networks

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