Good scan = good quality level? Well, it depends

Vij, Anjna

doi:10.1109/test.2002.1041902

Cited by 7 publications

(2 citation statements)

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“…There are several papers which compare structural and functional test methods [19] [16][17] [30]. These papers address issues for structural testing like test quality, test vector re-usability, and test application time.…”

Section: Introductionmentioning

confidence: 99%

FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani

Abraham

et al. 2012

2012 IEEE International Test Conference

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Abstract-FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related to the total number of gates in the system. We have measured fault coverage for OR1200 and IVM processors and compared the results with fault simulation performed by a commercial tool. We have also compared our results with fault sampling. Our results show that for large designs FALCON works faster (one order of magnitude) compared to fault simulation. It also has smaller error rate compared to fault sampling when the size of design under test grows.

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Section: Introductionmentioning

confidence: 99%

FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani

Abraham

et al. 2012

2012 IEEE International Test Conference

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“…Functional tests have been shown to detect unique defects that are not detected by structural tests [1] [2] [3]. As a result, functional tests generated for design verification are reused for manufacturing testing purposes.…”

Section: Introductionmentioning

confidence: 99%

A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests

Park¹,

Chen

Parvathala

et al. 2006

2006 IEEE International Test Conference

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When functional tests are used for manufacturing testing, their quality for detecting manufacturing defects needs to be evaluated. Evaluating functional tests using a traditional gate-level fault simulation environment has several disadvantages. To alleviate them, we describe a functional level coverage metric for estimating gate-level fault coverage that has a high degree of correlation to gate-level coverage. We borrow concepts from simulation-based design verification by defining fault detection conditions as coverage objects and monitoring their occurrence, also called their hit counts, during RTL simulation. To reduce the simulation overhead, we abstract gate-level fault detection conditions to the architectural level. The resulting hit counts are converted to an estimated fault coverage using a formula. Experimental results are presented on three datapath modules in a high-performance microprocessor considering two applications: identification of functional tests with high gate-level coverage relative to other tests, and identification of modules or module functions that require additional functional tests.

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