2002
DOI: 10.1016/s0040-6090(01)01518-8
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Grain boundaries and impurities in CdTe/CdS solar cells

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Cited by 64 publications
(45 citation statements)
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“…[9][10][11] Similarly the diffusion of S into the CdTe alters the optoelectronic properties of the CdTe layer at the interface. There is evidence that the presence of a CdS 1−x Te x interfacial layer resulting from interdiffusion of both S and Te produces more efficient photovoltic ͑PV͒ devices 12 and references therein.…”
Section: As Well As By Indiffusion Of Te Originating Frommentioning
confidence: 99%
“…[9][10][11] Similarly the diffusion of S into the CdTe alters the optoelectronic properties of the CdTe layer at the interface. There is evidence that the presence of a CdS 1−x Te x interfacial layer resulting from interdiffusion of both S and Te produces more efficient photovoltic ͑PV͒ devices 12 and references therein.…”
Section: As Well As By Indiffusion Of Te Originating Frommentioning
confidence: 99%
“…In high-temperature grown cells little or no grain growth is observed, except for the region close to the CdS/CdTe interface, where the small CdS grain size has caused the formation of small CdTe grains during the early stage of the deposition. 126 The overall density of stacking faults and misfit dislocations is reduced by recovery.…”
Section: Sodium Incorporation In Cigsmentioning
confidence: 99%
“…A useful comparison was made between the present results and the SIMS measurements previously obtained on similar structures from the back wall. 9 Moreover, the displacement of the positive-and negative-ion concentration peaks reported earlier 10 and the accumulation of Sb at the CdS/TCO interface 11 are called into question.…”
Section: Introductionmentioning
confidence: 97%
“…In studying the distribution of impurities in the CdS, particular care was taken to establish the positions of the concentration peaks for Cl, Na, and S. In a previous report, 10 these elements had been reported as having peaks that were displaced with respect to one another, the cations being closer to the TCO than the anions. The displacement had been attributed to the field structure at the interfaces.…”
mentioning
confidence: 99%