2018
DOI: 10.1017/s1431927618011546
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Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design

Abstract: In this work, we present a study of correlative grain boundary segregation analysis for an Inconel 718 superalloy using a newly-designed atom probe. The EIKOS™ atom probe provides a simpler design than the CAMECA's Local Electrode Atom Probe (LEAP™) and is primarily targeted towards metallurgical applications. The specimen carrier uses a wire geometry, which is well-suited for electropolishing methods of sample preparation, but can also accommodate focused ion beam (FIB) prepared liftout specimens. In addition… Show more

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