Grain size estimations of annealed Ti–Ni shape memory thin films

Zhang, Lei; Xie, Chi; Wu, Jinglei

doi:10.1016/j.jallcom.2006.06.018

Cited by 9 publications

(4 citation statements)

References 23 publications

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Section: Methodsmentioning

confidence: 99%

“…The X-ray diffraction (XRD) method of full width at half maximum (FWHM) peak intensity was preferred and allowed a qualitative comparison of the grain size between samples. 5,7 The X-ray diffractometer was a Philips X'Pert operated at 50 kV and 40 mA with an X-ray source of Cu (l51?54056 A ˚) and was used to characterise the powders and sintered samples. The size of the crystallites observed at the TEM was difficult to measure due to the high strain present in the MoSi 2 powder, a consequence of the fabrication method by mechanical alloying or high energy milling.…”

Section: Characterisation Of Powders and Partsmentioning

confidence: 99%

“…4 Energy and time saving are direct consequences of these advantages, which lead to a sintered part in a shorter time. 5 This allows sintering of the part without excessive grain growth, and thus, the initial nanometric grain can be maintained in the final part. The uniform and volumetric heating also results in enhanced mechanical properties.…”

Section: Introductionmentioning

confidence: 99%

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Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation

et al. 2012

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In this paper, MoSi 2 nanostructured powder is characterised by X-ray diffraction, scanning electron microscopy and transmission electron microscopy. The powder parts were fabricated by press and sinter process or powder injection moulding in order to investigate the impacts of the sintering process on the microstructure of materials and their properties. Two approaches were investigated for the sintering stage: conventional and microwave sintering. The microwave approach does not necessitate as high temperature as conventional sintering and is much shorter. The sintered specimens were characterised (density, microstructure and phases) to compare the efficiency of the different sintering approaches and their ability to maintain the nanograins of the initial MoSi 2 powder. The microwave sintering resulted in smaller grain size than either press and sinter process or powder injection moulding conventional sintered parts.

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Section: Methodsmentioning

confidence: 99%

Section: Characterisation Of Powders and Partsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation

et al. 2012

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“…Among all the existing methods to calculate the crystallite size of the coherent diffraction domains from diffraction peak, the Scherrer method is still the most applied method until currently. The crystallite size is calculated by Scherrer formula [15], as expressed:…”

Section: X-ray Diffraction Line Profile Analysismentioning

confidence: 99%

Preparation of Nanocrystalline γ-Alumina Using Ultrasonic Technique

Sebayang

Ade

Putrasari

et al. 2010

AMR

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The γ-alumina powder is a potential material for washcoat application. This paper shows the preparation of γ-alumina using ultrasonic technique in order to obtain nanocrystalline of γ-alumina powder. The 50 gr of the γ-alumina powders was treated in the 250 gr ethanol solution using ultrasonic technique within 10, 20, 30, and 60 minutes, respectively. The process of sonication was set at the fixed frequency (18.520 kHz) and current of 2 A. Crystallite size was evaluated by using X-ray diffraction (XRD) data based with Scherrer analysis and Williamson-Hall method. The microstructural characterization of the γ-alumina powders was observed using Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDX) analysis. The result shows that the optimum of nanocrystalline size of γ-alumina at ultrasonic process for 30 minutes are approximately 4.80 nm and 29.50 nm with Scherrer and Williamson-Hall calculation, respectively.

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Growth of Ni–Mn–Ga high-temperature shape memory alloy thin films by magnetron sputtering technique

Liu

Gao

et al. 2010

Applied Surface Science

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Grain size estimations of annealed Ti–Ni shape memory thin films

Cited by 9 publications

References 23 publications

Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation

Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation

Preparation of Nanocrystalline γ-Alumina Using Ultrasonic Technique

Growth of Ni–Mn–Ga high-temperature shape memory alloy thin films by magnetron sputtering technique

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Grain size estimations of annealed Ti–Ni shape memory thin films

Cited by 9 publications

References 23 publications

Conventional and microwave sintering of MoSi2nanostructured powder: powder and parts characterisation

Conventional and microwave sintering of MoSi2nanostructured powder: powder and parts characterisation

Preparation of Nanocrystalline γ-Alumina Using Ultrasonic Technique

Growth of Ni–Mn–Ga high-temperature shape memory alloy thin films by magnetron sputtering technique

Contact Info

Product

Resources

About

Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation

Conventional and microwave sintering of MoSi₂nanostructured powder: powder and parts characterisation