Ultrafine Grained Materials II 2002
DOI: 10.1002/9781118804537.ch67
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Grain Size, Size‐Distribution and Dislocation Structure from Diffraction Peak Profile Analysis

Abstract: Diffraction peak profile analysis (or Line Profile Analysis, LPA) has recently been developed to such an extent that it can be applied as a powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size-distribution and dislocation structures. Physically based theoretical functions and their Fourier coefficients are available for both, the size and the strain diffraction profiles. Strain anisotropy is rationalized in terms of the contrast factors of dislocatio… Show more

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“…The analysis of the line broadening was carried out using the Origin-6G computer program. Crystalline domains sizes D, values of crystalline lattice distortion and dislocation density ρ were estimated by means of Williamson-Hall methods [18,19]. The texture analysis was performed using the method of inverse pole figures (IPF) on the measurements in the normal direction (ND) to the rolling plane (ND IPF) and the rolling direction (RD IPF) taken on a DRON-3M diffractometer by using of the MoKα radiation in reflection mode from two sides of sheets after the corresponding number cycles of AB.…”
Section: Eejp 1 (2020)mentioning
confidence: 99%
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“…The analysis of the line broadening was carried out using the Origin-6G computer program. Crystalline domains sizes D, values of crystalline lattice distortion and dislocation density ρ were estimated by means of Williamson-Hall methods [18,19]. The texture analysis was performed using the method of inverse pole figures (IPF) on the measurements in the normal direction (ND) to the rolling plane (ND IPF) and the rolling direction (RD IPF) taken on a DRON-3M diffractometer by using of the MoKα radiation in reflection mode from two sides of sheets after the corresponding number cycles of AB.…”
Section: Eejp 1 (2020)mentioning
confidence: 99%
“…2, 4) was found. Therefore, further analysis was performed using the modified Williamson -Hall method [19]. The method for processing the width of diffraction peaks makes it possible to estimate the dislocations density.…”
Section: Eejp 1 (2020)mentioning
confidence: 99%
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