“…(It is expected that such a behavior is even more pronounced when the ERP format is used in the planar domain, which has more re-sampling and geometrical distortion than EAC. ); (iv) the uniform sampling with 40-degree fieldof-view provides the best performance for most of the metrics; (v) none of the metrics performs good enough on seams, which is a highly localized distortion that can be hidden on the global metrics; this result highlights the need for specific artifact metrics, such as [6]; and (vi) finally, it is possible to notice that the performance of the different metrics varies significantly according to the different distortion types and that there is not a single metric that performs the best for each individual distortion.…”