2023 IEEE East-West Design &Amp; Test Symposium (EWDTS) 2023
DOI: 10.1109/ewdts59469.2023.10297056
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Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency

Marampally Saikiran,
Michael Sekyere,
Mona Ganji
et al.
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