Abstract:Graphene film has been successfully grown on Cu foil by directly depositing carbon atoms with a solid source molecular beam epitaxy (SSMBE) system. The structural and electronic properties of the graphene sample are characterized by Raman spectroscopy, near edge X-ray absorption fine structure (NEXAFS) and X-ray photoelectron spectroscopy (XPS). Results indicate that the graphene has the tubostratic stacking structure.
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