2016
DOI: 10.1088/0957-4484/27/14/145204
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Graphene quantum dots as a highly efficient solution-processed charge trapping medium for organic nano-floating gate memory

Abstract: A highly efficient solution-processible charge trapping medium is a prerequisite to developing high-performance organic nano-floating gate memory (NFGM) devices. Although several candidates for the charge trapping layer have been proposed for organic memory, a method for significantly increasing the density of stored charges in nanoscale layers remains a considerable challenge. Here, solution-processible graphene quantum dots (GQDs) were prepared by a modified thermal plasma jet method; the GQDs were mostly co… Show more

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Cited by 29 publications
(13 citation statements)
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“…It is thought that the semi-metallic nature of rGO, having a covalently bonded honeycomb lattice structure, overcomes various defects including holes, which play an important role as charge trapping sites in charge trap memory devices. Transfer characteristics of ZnO TFT embedded with NAu-rGO nanocomposite exhibited a wider hysteresis window than that observed for various Au NP- and r-GO-based nano-floating gate dielectrics 55 , 56 . Figure 5e shows the output characteristics of the ZnO semiconductor layer with SiO 2 /NAu-rGO nanocomposite dielectric stack memory TFT as the gate voltage was varied from 0 to 40 V. The drain current increased with increasing gate voltage and reached saturation because of pinching-off of the active channel of the transistor, exhibiting typical n-type transistor behaviour.…”
Section: Resultsmentioning
confidence: 71%
“…It is thought that the semi-metallic nature of rGO, having a covalently bonded honeycomb lattice structure, overcomes various defects including holes, which play an important role as charge trapping sites in charge trap memory devices. Transfer characteristics of ZnO TFT embedded with NAu-rGO nanocomposite exhibited a wider hysteresis window than that observed for various Au NP- and r-GO-based nano-floating gate dielectrics 55 , 56 . Figure 5e shows the output characteristics of the ZnO semiconductor layer with SiO 2 /NAu-rGO nanocomposite dielectric stack memory TFT as the gate voltage was varied from 0 to 40 V. The drain current increased with increasing gate voltage and reached saturation because of pinching-off of the active channel of the transistor, exhibiting typical n-type transistor behaviour.…”
Section: Resultsmentioning
confidence: 71%
“…In the following, we compare the GaTe FGM with the state-of-the-art memristors fabricated from other 2D materials. [21][22][23][24][25][26][27][28][29][30][31] Given that retention of the erased and/or programmed states is one of the most important parameter of such FGM, we recorded along direction-y the on state (by a positive gate pulse), and the off state (by a negative gate pulse), respectively. Among GaTe FGM devices tested, the best performance (measured from sample-S4 as shown in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…Among the organic memory technologies, floating‐gate organic transistor memory (FGOTM) has attracted tremendous attentions due to its unique advantages, such as nondestructive read, sophisticated data‐storage mechanism, reliable long‐term data retention capacity, ultrahigh storage density, and easy compatibility with integrated circuits . Among the extensive research over the past decades, many efforts have been made on the study of structure of FGOTM and chargeable floating gate materials, including metal nanoparticles, semiconductor nanoparticles, small molecules, quantum dots, and carbon materials . Unfortunately, the key parameters such as driving ability and operating speed of FGOTM have received little attention, which are not only the important specification for applications in microelectronics such as organic electronics, integrated circuit, and sensors but also crucial for the fundamental understanding of the physical mechanism of carrier transport in FGOTM.…”
Section: Introductionmentioning
confidence: 99%