“…Figure a to d shows the XRD patterns of as grown and annealed hybrid PVA‐InTiO thin films. The XRD pattern showed main crystalline characteristic peaks at around 2 θ = 27°, 36°, 41°, and 54° corresponding to (110), (101), (111), and (211) planes of rutile TiO 2 and the peaks at 2 θ = 30°, 33°, 36°, 45°, 51°, and 60°, respectively, corresponding to (211), (222), (400), (431), (440), and (622) planes of cubic In 2 O 3 . The XRD patterns of as grown and annealed films exhibit the presence of broad hump (amorphous hallows) centered at around 23° because of the diffused scattering of amorphous PVA matrix.…”