Group SkSP-R sampling plan for accelerated life tests

Aslam, Muhammad; Khan, Nasrullah

doi:10.1007/s12046-017-0721-x

Cited by 4 publications

(1 citation statement)

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“…Some studies suggested other sampling plans. Aslam et al [27] developed an SkSP-V sampling plan for ALT when product lifetime followed the Weibull distribution, while Aslam et al [28] proposed a group skip-lot sampling plan using ALT resampling when the product lifetime followed the Weibull distribution. Statistical inference for ALTs under various types of stress (constant-stress, step-stress and progressive-stress) has also been proposed for censoring data under various lifetime distributions.…”

Section: Introductionmentioning

confidence: 99%

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Charongrattanasakul¹,

Bamrungsetthapong²,

Kumam³

2023

Computer Systems Science and Engineering

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A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the ALT. A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number (ASN) and total cost of inspection (TC) under both producer's and consumer's risks. Numerical results are presented to support the AMDSSP for the ALT, while performance comparisons between the AMDSSP, the MDSSP and a single sampling plan (SSP) for the ALT are discussed. Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions. The AMDSSP also had a higher operating characteristic (OC) curve than both the existing sampling plans. Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

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Section: Introductionmentioning

confidence: 99%