1996
DOI: 10.1016/0022-0248(95)00993-0
|View full text |Cite
|
Sign up to set email alerts
|

Growth and characterisation of Hg1 − xCdxTe (0.21 < x < 0.36) epilayers grown from Te-rich solution by the dipping technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

1998
1998
2023
2023

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 18 publications
0
3
0
Order By: Relevance
“…Edwall et al [33], for example, have claimed that, on the 111 B face, a misorientation of up to 2 • could give rise to surface undulations with a peak-to-valley height on the surface of 100-500 nm. Such large variations in the surface layer would have been detected by both the doublecrystal x-ray rocking curve (using InSb as the first crystal) [34] and electrolyte electroreflectance (EER) measurements [35] which were carried out on this sample. A value in the range 50-70 arc seconds for the FWHM was obtained from the rocking curves and, from the EER measurements, a broadening parameter of 0.11 eV was recorded.…”
Section: Discussionmentioning
confidence: 99%
“…Edwall et al [33], for example, have claimed that, on the 111 B face, a misorientation of up to 2 • could give rise to surface undulations with a peak-to-valley height on the surface of 100-500 nm. Such large variations in the surface layer would have been detected by both the doublecrystal x-ray rocking curve (using InSb as the first crystal) [34] and electrolyte electroreflectance (EER) measurements [35] which were carried out on this sample. A value in the range 50-70 arc seconds for the FWHM was obtained from the rocking curves and, from the EER measurements, a broadening parameter of 0.11 eV was recorded.…”
Section: Discussionmentioning
confidence: 99%
“…Variable temperature Hall measurements were carried out using S-110 Keithley Hall measurement system. MCT epilayers were grown on these substrates from Terich solution using liquid phase epitaxial (LPE) process [8].…”
Section: Methodsmentioning
confidence: 99%
“…Nanostructures are becoming increasingly important for technology and basic science. 1 Fabrication techniques currently employed for material deposition include low-pressure chemical vapor deposition (LPCVD), 2 laser-assisted chemical vapor deposition (LCVD), 3 plasma-enhanced chemical vapor deposition (PECVD), 4,5 ultraviolet stereo lithography, 6 spinning, 7 dipping, 8 spraying, 9 and electrodeposition. [10][11][12][13][14][15] Electrodeposition methods have many advantages over the other stated techniques and are attractive, as they are simple, inexpensive, reproducible, and damage-free.…”
mentioning
confidence: 99%