Growth and characteristics of Fe-doped KTiOPO4 crystals

Shi, Lu; Chong, Tow Chong; Xu, XW

doi:10.1016/s0022-0248(98)01007-0

Cited by 5 publications

(2 citation statements)

References 10 publications

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“…It is obvious from the figure that the two equal parts of the crystal are related by the twinmirror plane parallel to the (010) in the middle of the crystal. The phenomenon of the formation of bicrystal has been reported in TSSG grown KTP crystals (SHI et al 1994(SHI et al , 1999. The reason suggested is the formation of individual nucleus during initial stages of the growth and agglomeration of pre-existing crystals already possessing the twin element.…”

Section: Crystal Growthmentioning

confidence: 93%

Growth of Inclusion Free KTP Crystals by Top Seeded Solution Growth and their Characterization

Kannan

Ganesamoorthy

Kumaragurubaran

et al. 2002

Cryst. Res. Technol.

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Section: Crystal Growthmentioning

confidence: 93%

Growth of Inclusion Free KTP Crystals by Top Seeded Solution Growth and their Characterization

Kannan

Ganesamoorthy

Kumaragurubaran

et al. 2002

Cryst. Res. Technol.

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“…Shi et al (1999) and Zaldo et al (1999) have reported the effect of impurities and defects, particularly on the optical and structural aspects of KTP crystals. The quality of large KTP crystals can be characterized by X-ray topography using characteristic X-ray radiation and synchrotron white radiation (Bolt et al, 1991;Halfpenny et al, 1991;Stolzenberger, 1988).…”

Section: Introductionmentioning

confidence: 99%

Analysis of crystalline perfection of pure and Mo-doped KTP crystals on different growth planes by high-resolution X-ray diffraction

Gandhi¹,

Rathnakumari²,

Muralimanohar³

et al. 2014

J Appl Cryst

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Single crystals of pure and molybdenum (Mo)-doped potassium titanyl phosphate (KTP) crystals were grown by the high-temperature solution growth technique. The presence of dopant ions in the grown crystal was confirmed by energy-dispersive X-ray analysis. Grown crystals, cut along various growth planes such as (100), (011) or (201), were analysed for crystalline perfection using high-resolution X-ray diffraction (HRXRD). Although the HRXRD study showed that the crystalline perfection of most of the crystals was quite good without any structural defects, structural grain boundaries were observed in some of the crystals chosen for study. The observed structural defects are probably due to mechanical or thermal fluctuations occurring during the growth process.

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Growth, structural and optical studies of chromium doped KTiOPO4 single crystals

Kannan

Ganesamoorthy

Bocelli³

et al. 2003

Journal of Crystal Growth

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Growth and characteristics of Fe-doped KTiOPO4 crystals

Cited by 5 publications

References 10 publications

Growth of Inclusion Free KTP Crystals by Top Seeded Solution Growth and their Characterization

Growth of Inclusion Free KTP Crystals by Top Seeded Solution Growth and their Characterization

Analysis of crystalline perfection of pure and Mo-doped KTP crystals on different growth planes by high-resolution X-ray diffraction

Growth, structural and optical studies of chromium doped KTiOPO4 single crystals

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