2004
DOI: 10.1016/j.jcrysgro.2004.03.052
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Growth and characterization of axially periodic Zn2SnO4 (ZTO) nanostructures

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Cited by 91 publications
(49 citation statements)
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“…The peak at 520 cm À1 was attributed to the Si substrate, and that at 665 cm À1 to the ZTO phase. 27,34,37 No Raman modes of other phases such as ZnO, SnO 2 or SnO were observed. Samples were of a highly pure single phase.…”
Section: Resultsmentioning
confidence: 97%
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“…The peak at 520 cm À1 was attributed to the Si substrate, and that at 665 cm À1 to the ZTO phase. 27,34,37 No Raman modes of other phases such as ZnO, SnO 2 or SnO were observed. Samples were of a highly pure single phase.…”
Section: Resultsmentioning
confidence: 97%
“…These results greatly improve on the purity of ZTO nanowires in previous reports. 34,36 Raman spectra were recorded to further check for impurities. Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…These materials have been thoroughly investigated and employed in many applications. However, ternary oxide TCOs such as Zn 2 SnO 4 [1], CdIn 2 O 4 [2], ZnGa 2 O 4 [3] and Cd 2 SnO 4 [4] have eminent properties required for a transparent conducting oxide (TCO). Amongst these TCOs, n-type ternary Cd 2 SnO 4 thin films show low electrical resistivity (10 −4 cm), high transmission (>90%) in the visible region and smoother surfaces than conventional SnO 2 TCO films [5,6].…”
Section: Introductionmentioning
confidence: 99%