Abstract. In this paper we discuss the procedures for photoacoustic measurements for semiconducting materials, including bulk samples like Gallium Antimonide (GaSb). The optical absorption at photon energies near the band gap was measured at room temperature using Fourier Transform Infrared Photoacoustic spectroscopy (FTIR-PAS). Measurements were performed using a NEXUS 670 FTIR-spectrometer (from Thermo Nicolet) with a MTEC model 300 PA cell (MTEC Photoacoustics, Inc.). Optical properties of the studied samples were determined from their room temperature PA spectra and band gaps were calculated directly from absorption spectra
IntroductionFourier transform infrared (FTIR) spectroscopy is a characterization technique widely used in physics, chemistry, and biology. FTIR spectroscopy is also employed as one of the methods for evaluating semiconductors materials. FTIR Photoacoustic spectroscopy (FTIR-PAS) is based on the principle of detecting the sample's IR spectrum by "listening" to the sound generated when the sample absorbs infrared radiation. PAS methods have been used extensively for nondestructive characterization of semiconductors and other materials [1][2][3][4]. In FTIR PAS, the IR radiation from a Michelson interferometer is incident on the sample kept in a closed chamber (PA cell), a periodic heat flow is generated inside the sample due to the absorption of this excitation energy. The absorption spectrum of a substance is obtained by detecting and deconvoluting the periodic thermal changes occurring in the sample in the form of the photoacoustic signal generated due to micropressure changes in the surrounding gas in the cell . A highly sensitive microphone is used as a detector and the acoustic signal is thus modulated by the interferogram of the irradiating source summed with the absorption spectrum of the sample, later by Fourier transformation of this signal, the absorption spectrum can be obtained [5]. One of the major advantages of FTIR-PAS is its relative immunity to scattered light. Consequently, this methodology can provide absorption spectra of highly light-scattering materials such as powders (e.g. silica, alumina) or highly-absorbing materials (opaque). The opacity problem has been remedied by reducing the optical density of samples to a suitable level. However, this approach leaves much to be desired due to the time and labor involved, the risk of the sample alteration and preparation error, and the destructive nature of the process. FTIR-PAS is a nondestructive measuring method for semiconductor material, and it does not require sample pretreatment. The non radiative transitions processes which are associated with the band structure, the defect related energy loss mechanism, etc. can be obtained directly from the analysis of PAS spectra. The measurement of the absorption spectrum leads to the energy band gap determination for different kind of semiconductors. When the energy of the incident photon is equal to the band gap energy (E g ), it could be absorbed creating an electron-hole pair; ...