2011
DOI: 10.1016/j.matchemphys.2010.12.040
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Growth and characterization of l-leucine l-leucinium picrate single crystal: A new nonlinear optical material

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Cited by 121 publications
(26 citation statements)
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“…Since the main crystal block has reasonably good crystalline perfection, such defects may not have much influence on the physical properties, as shall be discussed in the following section. However, a quantitative analysis of such defects, which are often unavoidable owing to the nature of the material and the growth method, is of great importance in certain device applications, for example, phase matching applications in nonlinear optical crystals (Bhagavannarayana, Riscob & Shakir, 2011) and piezoelectric applications .…”
Section: High-resolution Xrd Analysismentioning
confidence: 99%
“…Since the main crystal block has reasonably good crystalline perfection, such defects may not have much influence on the physical properties, as shall be discussed in the following section. However, a quantitative analysis of such defects, which are often unavoidable owing to the nature of the material and the growth method, is of great importance in certain device applications, for example, phase matching applications in nonlinear optical crystals (Bhagavannarayana, Riscob & Shakir, 2011) and piezoelectric applications .…”
Section: High-resolution Xrd Analysismentioning
confidence: 99%
“…The influence of such defects may not influence much on the NLO properties. However, a quantitative analysis of such unavoidable defects is of great importance, particularly in the case of phase matching applications as explained in our recent article [18]. The spectral bands are interpreted and compared with the standard spectra of the functional groups [19,20].…”
Section: Hrxrd Analysismentioning
confidence: 99%
“…The influence of such defects may not influence much on the NLO properties. However, a quantitative analysis of such unavoidable defects is of great importance, particularly in the case of phase-matching applications as explained in the article [15].…”
Section: High-resolution X-ray Diffraction Analysismentioning
confidence: 99%