2011
DOI: 10.1116/1.3555388
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Growth and characterization of TbAs:GaAs nanocomposites

Abstract: Recently, there has been interest in semimetallic rare earth monopnictide nanoparticles epitaxially embedded in III-V semiconductors due to the drastic changes brought about in these materials' electrical and thermal properties. The properties of terbium codeposited with gallium arsenide by molecular beam epitaxy are discussed here. These new materials were characterized by x-ray diffraction, Rutherford backscattering spectrometry, resistivity measurements, photoluminescence, time-domain thermoreflectance ther… Show more

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Cited by 20 publications
(15 citation statements)
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“…First, radiative lifetimes for nanostructures are typically on the order of 1 ns [18], which is significantly longer than the lifetimes observed for τ 1. Second, spectrophotometry and Fourier transform infrared (FTIR) measurements out to 12 μm reveal only one absorption peak for TbAs:GaAs, at 750 meV [14]. However, we observe no photoluminescence associated with this absorption peak, suggesting that this peak could not be associated with a direct band gap.…”
Section: A Fluence Dependence Measurementsmentioning
confidence: 62%
See 1 more Smart Citation
“…First, radiative lifetimes for nanostructures are typically on the order of 1 ns [18], which is significantly longer than the lifetimes observed for τ 1. Second, spectrophotometry and Fourier transform infrared (FTIR) measurements out to 12 μm reveal only one absorption peak for TbAs:GaAs, at 750 meV [14]. However, we observe no photoluminescence associated with this absorption peak, suggesting that this peak could not be associated with a direct band gap.…”
Section: A Fluence Dependence Measurementsmentioning
confidence: 62%
“…For this sample, a Tb source temperature of 1345 • C was used, resulting in a TbAs concentration of 2.12%. Based on these growth conditions and using an average nanoparticle diameter of 1.1 nm, measured from samples of similar growths [14], a TbAs nanoinclusion density of 3.2 × 10 19 cm −3 was calculated.…”
Section: A Sample Fabricationmentioning
confidence: 99%
“…The time-domain thermoreflectance (TDTR) technique was employed to measure the thermal conductivity of the ScN thin films. [24][25][26] In the TDTR setup, a Ti:sappire laser was used to create femtosecond laser pulses with $12.5 ns repetition rate and a fixed laser power of 25 MW. The laser pulses were split into a pump beam (18 MW) and a probe beam (7 MW).…”
Section: Methodsmentioning
confidence: 99%
“…The thermal conductivity of the ScN thin film was obtained by fitting the measurement data with a 3D thermal model based on thermal quadrupoles. 26 Plane-wave self-consistent field (PWSCF) implementation of DFT was employed with a generalized gradient approximation (GGA) to the exchange correlation energy 27 and ultrasoft pseudopotentials 28 to represent the interaction between ionic cores and valence electrons. Plane-wave basis sets (PWs) with cut-off energies of 30 Ry and 180 Ry were used to represent the electronic wave functions and charge densities, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…A Ti: Sapphire laser was used in the TDTR setup to create short pulsed laser beams with $12.5 ns repetition rate. 26,27 In the measurement, the laser pulses were split into pump beam and probe beam. The pump beam was used to create a temperature rise on the sample surface.…”
Section: B Time-domain Thermoreflectance (Tdtr) Measurementmentioning
confidence: 99%