Growth and characterization of thin ZnO films deposited on glass substrates by electrodeposition technique

Mouet, T.; Devers, Thierry; Telia, A.; Messai, Z.; Harel, Valérie; Konstantinov, Konstantin; Kante, I.; Ta, Minh Tri

doi:10.1016/j.apsusc.2010.01.093

Cited by 20 publications

(10 citation statements)

References 39 publications

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“…Experimental Tauc plots were digitized from 73 plots collected from 63 published works, and the extracted slope values were collected into a histogram binned by order of magnitude. Additionally, the collected slopes, NEAR values, and reported and fitted E g values are shown in the Supporting Information.…”

Section: Resultsmentioning

confidence: 99%

Assessing Tauc Plot Slope Quantification: ZnO Thin Films as a Model System

Coulter

Birnie

2017

Physica Status Solidi (b)

227

107

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One of the most frequently used methods for characterizing thin films is UV–Vis absorption. The near‐edge region can be fitted to a simple expression where the intercept gives the band gap and the fitting exponent identifies the electronic transition as direct or indirect. [See Tauc et al., Physica Status Solidi 15, 627 (1966); naturally, these are usually called “Tauc” plots.] In earlier work, we found that direct band gaps fitted using Tauc's method can be quite accurate, to ∼1% [see Viezbicke et al., Phys. Status Solidi B 252, 1700 (2015)]. Still, slopes of these Tauc plots are less frequently quantified, even though the slopes are directly rooted in key band‐structure parameters. In this study, we examine the reproducibility of Tauc plot slopes for ZnO as a model direct‐gap material and compare these experimental values with the theoretically derived slope. In contrast to the band gap accuracy, the experimental slope values varied by several orders of magnitude. The histogram of slope values was significantly more compact for Tauc plots exhibiting less Urbach tail contribution. In these cases, the Tauc slopes can provide an order‐of‐magnitude quantification of other key band characteristics such as carrier effective mass.

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Section: Resultsmentioning

confidence: 99%

Assessing Tauc Plot Slope Quantification: ZnO Thin Films as a Model System

Coulter

Birnie

2017

Physica Status Solidi (b)

227

107

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“…As noted above, we collected a large number of published Tauc analyses of undoped ZnO that included plots of the absorbance data against the photon energy . This was critical, as our assessment of the application of the Tauc method required the consistent application of a fitting method, as described below.…”

Section: Modelmentioning

confidence: 99%

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Viezbicke

Patel

Davis

et al. 2015

Phys. Status Solidi B

934

419

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One of the most frequently used methods for characterizing thin films is UV–Vis absorption. The near‐edge region can be fitted to a simple expression in which the intercept gives the band‐gap and the fitting exponent identifies the electronic transition as direct or indirect (see Tauc et al., Phys. Status Solidi 15, 627 (1966); these are often called “Tauc” plots). While the technique is powerful and simple, the accuracy of the fitted band‐gap result is seldom stated or known. We tackle this question by refitting a large number of Tauc plots from the literature and look for trends. Nominally pure zinc oxide (ZnO) was chosen as a material with limited intrinsic deviation from stoichiometry and which has been widely studied. Our examination of the band gap values and their distribution leads to a discussion of some experimental factors that can bias the data and lead to either smaller or larger apparent values than would be expected. Finally, an easily evaluated figure‐of‐merit is defined that may help guide more accurate Tauc fitting. For samples with relatively sharper Tauc plot shapes, the population yields Eg(ZnO) as 3.276 ± 0.033 eV, in good agreement with data for single crystalline material.

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“…21 Zinc oxide is a non toxic direct wide-bandgap (3.3 eV) transparent semiconductor material widely used in the fields of chemical sensors, piezoelectric transducers, light emitting devices, photosensors and photovoltaic cells. 22 ZnO thin films can be deposited by several techniques such as sputtering, 23 pulsed laser deposition, 24,25 spray pyrolysis, 26 chemical bath deposition, 27 and electrodeposition, [28][29][30][31] the latter being the simplest. A variety of morphologies has been obtained depending on the used technique and conditions.…”

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confidence: 99%

Electrodeposition Growth of Oriented ZnO Deposits in Ionic Liquid Media

Tułodziecki

Tarascon

Taberna

et al. 2012

J. Electrochem. Soc.

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ZnO is a material of great interest for microelectronics because it offers a panel of attractive physical properties. It has been grown for decades as thin films from a wide variety of physical-chemical deposition techniques, most of them leading to films oriented with the polar direction perpendicular to the substrate. Here we report the electrodeposition of ZnO in ionic liquids (EMImTFSI (1-ethyl-3methylimidazolium bis(trifluoromethylsulfonyl)imide), BMPTFSI (1-Butyl-1-Methylpyrrolidinium bis(trifluoromethylsulfonyl)imide) or BMImTf (1-butyl-3-methylimidazolium trifluoromethanesulfonate)), together with the feasibility of manipulating the growth orientation of the ZnO deposits by adding the proper co-solvent to ionic liquid. We establish solvent dielectric constant as a key parameter to tailor the deposit growth direction. Moreover, via the use of Electrochemical Quartz Crystal Microbalance (EQCM) measurements, we determine the importance of the competition between Zn 2+ and O 2 reduction to properly trigger the transport phenomena leading to the growth of ZnO. This work provides insight which can be implemented to the growth of other binary and ternary oxides deposits in ionic liquid media, a field still poorly explored.

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Growth and characterization of thin ZnO films deposited on glass substrates by electrodeposition technique

Cited by 20 publications

References 39 publications

Assessing Tauc Plot Slope Quantification: ZnO Thin Films as a Model System

Assessing Tauc Plot Slope Quantification: ZnO Thin Films as a Model System

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Electrodeposition Growth of Oriented ZnO Deposits in Ionic Liquid Media

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