2013
DOI: 10.1016/j.tsf.2013.03.013
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Growth and characterization of tin sulphide thin films by chemical bath deposition using ethylene diamine tetra-acetic acid as the complexing agent

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Cited by 43 publications
(11 citation statements)
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“…There are no other secondary peaks in the Raman spectra in the range 120-500 cm -1 for the CZTS films subjected to LAN, except for the small shoulder at about 135 cm -1 , which can be identified as mixed phases of copper sulphides [25]. Raman spectra of the samples upon SVA at high temperatures (T ann =450-500°C) exhibit two small secondary peaks at 183 cm -1 and 218 cm -1 attributed to SnS phase [26]. This observation is also consistent with XRD results.…”
Section: Accepted Manuscriptmentioning
confidence: 89%
“…There are no other secondary peaks in the Raman spectra in the range 120-500 cm -1 for the CZTS films subjected to LAN, except for the small shoulder at about 135 cm -1 , which can be identified as mixed phases of copper sulphides [25]. Raman spectra of the samples upon SVA at high temperatures (T ann =450-500°C) exhibit two small secondary peaks at 183 cm -1 and 218 cm -1 attributed to SnS phase [26]. This observation is also consistent with XRD results.…”
Section: Accepted Manuscriptmentioning
confidence: 89%
“…These layers were deposited at room temperature. SnS films were deposited from an optimized bath developed by us earlier [29] using EDTA as the complexing agent. The bath contains stannous chloride The deposition time to obtain the desired 150 nm thick CuS film was 2 h. After the deposition, the substrates were removed from the bath, washed with distilled water, naturally dried and kept in a vacuum desiccator until they were transferred to a tubular furnace for annealing in the second stage.…”
Section: Methodsmentioning
confidence: 99%
“…The effect of changes in the S source concentration on the band gap of o-SnS films is controversial until the present. A reduction in band gap from 1.70 eV to 1.25 eV with increasing TA concentrations was reported in [ 200 ], although no significant change in band gap was found with TA concentration in [ 198 ]. On the other hand, no studies in the literature have focused on the influence of S precursor concentration on the properties of c-SnS, SnS 2, and Sn 2 S 3 films.…”
Section: Influence Of Deposition Parameters On Sn X S Y Thin Film Growth and Propertiesmentioning
confidence: 96%
“…Furthermore, the S precursor concentration can influence the morphology and phase formation of o-SnS films ( Figure 7 e). A higher TA concentration stimulates the formation of multi phases such as Sn 2 S 3 and Sn 3 S 4 (Sn 2 S 3 + SnS → Sn 3 S 4 ) [ 209 ] and a lower TA concentration assists the growth of single-phase o-SnS films, but with lower crystallinity [ 142 , 198 ]. A TA concentration of 0.1 M is preferable for the deposition of a single-phase, polycrystalline o-SnS with (101) preferred orientation [ 198 ], and a ST concentration of 0.75 M is advisable for (111)/(040) preferred orientation ( Figure 7 f).…”
Section: Influence Of Deposition Parameters On Sn X S Y Thin Film Growth and Propertiesmentioning
confidence: 99%
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