2001
DOI: 10.1016/s0022-0248(01)00625-x
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Growth and device applications of III-nitrides by MBE

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Cited by 51 publications
(47 citation statements)
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“…Inset shows experimental reflectivity spectra from this DBR along with simulation results based on the transition matrix method. [153] Figure 32. Schematics of investigated DBRs with (a) square, (b) sinusoidal, (c) triangular, and (d) sawtooth AlGaN grading profiles.…”
Section: Distributed Bragg Reflectorsmentioning
confidence: 99%
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“…Inset shows experimental reflectivity spectra from this DBR along with simulation results based on the transition matrix method. [153] Figure 32. Schematics of investigated DBRs with (a) square, (b) sinusoidal, (c) triangular, and (d) sawtooth AlGaN grading profiles.…”
Section: Distributed Bragg Reflectorsmentioning
confidence: 99%
“…[152] The cross-section TEM micrograph of a DBR stack consisting of 20.5 periods of AlN/GaN with thickness of 62.3 and 40.3 nm, respectively, is shown in Figure 31. [153] The reflectivity spectra of this DBR structure is also shown in the inset along with simulation results based on the transmission matrix method. The peak reflectance of 99% occurred at a center wavelength of 465 nm and the reflectance bandwidth is 45 nm.…”
Section: Distributed Bragg Reflectorsmentioning
confidence: 99%
“…Until very recently, the key achievements and developments in the field of InGaN laser diodes have been made by the metal-organic vapour-phase epitaxy (MOVPE) technique [1,2].I n spite of many potential advantages for MBE growth, such as in situ monitoring techniques [3][4][5], the low quantum efficiency of MBEgrown optoelectronic structures compared with MOVPE led many researchers to conclude that MBE cannot compete with MOVPE. It was also commonly believed that the only solution for MBE would be to bring the growth conditions as close as possible to the MOVPE, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…However, the corrosive nature of ammonia compounded by its large flows creates additional hazards and technological challenges, and also leads to undesirable high hydrogen background during the epitaxial process. In the more widely employed plasma-assisted MBE (PAMBE) [5], purified nitrogen gas is activated using an RF-plasma and supplied to the growth surface at typical flow rates of 1-2 sccm. Early experimental results [7] showed that unlike ammonia MBE, PAMBE requires group III-rich conditions to achieve good material quality.…”
Section: Introductionmentioning
confidence: 99%
“…In spite of MBE's many potential advantages, such as much better qual-ity of interfaces, sharper doping profiles and superior in situ growth monitoring capabilities [3][4][5], the considerably inferior optical quality of grown layers, when compared to similar structures grown by MOVPE, fueled widespread belief that this technique would never become a viable alternative in the field of GaN based optoelectronics. Only very recently the room temperature, pulsed operation of MBE-grown laser diodes (LDs) with 400 nm emission wavelength was demonstrated [6].…”
Section: Introductionmentioning
confidence: 99%