2019
DOI: 10.1002/crat.201900129
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Growth and Properties of Intentionally Carbon‐Doped GaN Layers

Abstract: Carbon-doping of GaN layers with thickness in the mm-range is performed by hydride vapor phase epitaxy. Characterization by optical and electrical measurements reveals semi-insulating behavior with a maximum of specific resistivity of 2 × 10 10 cm at room temperature found for a carbon concentration of 8.8 × 10 18 cm −3 . For higher carbon levels up to 3.5 × 10 19 cm −3 , a slight increase of the conductivity is observed and related to self-compensation and passivation of the acceptor. The acceptor can be iden… Show more

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Cited by 28 publications
(24 citation statements)
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“…[31,33,34,38,39] This is in good agreement with experimental findings of a thermally activated reduction in the resistivity of carbon-doped GaN with an activation energy E A ¼ ð0.95 AE 0.10Þ eV. [40][41][42][43] Furthermore, the acceptor nature of the main defect in carbon-doped bulk GaN was recently verified by the observation of p-type conductivity that was thermally activated with E A ¼ 1.02 eV. [41,44] The calculated acceptor level also agrees with the properties of the commonly observed H1 hole trap at E V þ 0.85-0.90 eV analyzed by deep level transient spectroscopy (DLTS) or minority carrier transient spectroscopy [45][46][47][48][49][50][51][52] and the .…”
Section: Luminescence Of Single Carbon Defectssupporting
confidence: 90%
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“…[31,33,34,38,39] This is in good agreement with experimental findings of a thermally activated reduction in the resistivity of carbon-doped GaN with an activation energy E A ¼ ð0.95 AE 0.10Þ eV. [40][41][42][43] Furthermore, the acceptor nature of the main defect in carbon-doped bulk GaN was recently verified by the observation of p-type conductivity that was thermally activated with E A ¼ 1.02 eV. [41,44] The calculated acceptor level also agrees with the properties of the commonly observed H1 hole trap at E V þ 0.85-0.90 eV analyzed by deep level transient spectroscopy (DLTS) or minority carrier transient spectroscopy [45][46][47][48][49][50][51][52] and the .…”
Section: Luminescence Of Single Carbon Defectssupporting
confidence: 90%
“…In particular, the sharp emission onset around 2.6 eV is often obscured by green emission in HVPE-grown GaN. [42,43] Nevertheless, recent improvement of bulk material quality enabled the direct observation of the ZPL in PL measurements. This is shown exemplarily in Figure 4 by data obtained from an undoped bulk GaN sample grown by HVPE.…”
Section: Luminescence Of Single Carbon Defectsmentioning
confidence: 99%
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